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Scanning reflection ion microscopy in a helium ion microscope
Research output
:
Contribution to journal
›
Article
Department of Nuclear Physics Research Methods
Department of Solid State Electronics
Overview
Cite this
Links
http://www.beilstein-journals.org/bjnano/single/articleFullText.htm?publicId=2190-4286-6-114
DOI
https://doi.org/10.3762/bjnano.6.114
Other version
Y.V. Petrov
O.F. Vyvenko
Original language
English
Pages (from-to)
1125-1137
Journal
Beilstein Journal of Nanotechnology
Volume
6
DOIs
https://doi.org/10.3762/bjnano.6.114
State
Published -
2015
ID: 3932674
