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Real-time analysis of dielectric-spectrometric information about surface condition. / Almazov, A. A.; Egorov, N. V.; Karpov, A. G.

In: Surface Investigation X-Ray, Synchrotron and Neutron Techniques, Vol. 15, No. 10, 01.12.2000, p. 1485-1495.

Research output: Contribution to journal › Article › peer-review

Harvard

Almazov, AA, Egorov, NV & Karpov, AG 2000, 'Real-time analysis of dielectric-spectrometric information about surface condition', Surface Investigation X-Ray, Synchrotron and Neutron Techniques, vol. 15, no. 10, pp. 1485-1495.

APA

Almazov, A. A., Egorov, N. V., & Karpov, A. G. (2000). Real-time analysis of dielectric-spectrometric information about surface condition. Surface Investigation X-Ray, Synchrotron and Neutron Techniques, 15(10), 1485-1495.

Vancouver

Almazov AA, Egorov NV, Karpov AG. Real-time analysis of dielectric-spectrometric information about surface condition. Surface Investigation X-Ray, Synchrotron and Neutron Techniques. 2000 Dec 1;15(10):1485-1495.

Author

Almazov, A. A. ; Egorov, N. V. ; Karpov, A. G. / Real-time analysis of dielectric-spectrometric information about surface condition. In: Surface Investigation X-Ray, Synchrotron and Neutron Techniques. 2000 ; Vol. 15, No. 10. pp. 1485-1495.

BibTeX

@article{76b0aa4c4812486ea17a181a7b390bb3,
title = "Real-time analysis of dielectric-spectrometric information about surface condition",
abstract = "The technique of the determination of surface conditions of dielectric and semiconductor materials is described. The basis of this technique is dielectric spectrometry. An effective technique of the rapid analysis of the information about surface conditions has been proposed. This technique is based on the iteration Fourier analysis in the real time scale. The algorithm for the calculation of basic parameters of the surface under investigation has been described.",
author = "Almazov, {A. A.} and Egorov, {N. V.} and Karpov, {A. G.}",
year = "2000",
month = dec,
day = "1",
language = "English",
volume = "15",
pages = "1485--1495",
journal = "ПОВЕРХНОСТЬ. РЕНТГЕНОВСКИЕ, СИНХРОТРОННЫЕ И НЕЙТРОННЫЕ ИССЛЕДОВАНИЯ",
issn = "1027-4510",
publisher = "МАИК {"}Наука/Интерпериодика{"}",
number = "10",

}

RIS

TY - JOUR

T1 - Real-time analysis of dielectric-spectrometric information about surface condition

AU - Almazov, A. A.

AU - Egorov, N. V.

AU - Karpov, A. G.

PY - 2000/12/1

Y1 - 2000/12/1

N2 - The technique of the determination of surface conditions of dielectric and semiconductor materials is described. The basis of this technique is dielectric spectrometry. An effective technique of the rapid analysis of the information about surface conditions has been proposed. This technique is based on the iteration Fourier analysis in the real time scale. The algorithm for the calculation of basic parameters of the surface under investigation has been described.

AB - The technique of the determination of surface conditions of dielectric and semiconductor materials is described. The basis of this technique is dielectric spectrometry. An effective technique of the rapid analysis of the information about surface conditions has been proposed. This technique is based on the iteration Fourier analysis in the real time scale. The algorithm for the calculation of basic parameters of the surface under investigation has been described.

UR - http://www.scopus.com/inward/record.url?scp=0034461043&partnerID=8YFLogxK

M3 - Article

AN - SCOPUS:0034461043

VL - 15

SP - 1485

EP - 1495

JO - ПОВЕРХНОСТЬ. РЕНТГЕНОВСКИЕ, СИНХРОТРОННЫЕ И НЕЙТРОННЫЕ ИССЛЕДОВАНИЯ

JF - ПОВЕРХНОСТЬ. РЕНТГЕНОВСКИЕ, СИНХРОТРОННЫЕ И НЕЙТРОННЫЕ ИССЛЕДОВАНИЯ

SN - 1027-4510

IS - 10

ER -

ID: 52377517