Research output: Contribution to journal › Article › peer-review
Non-thermal and low-destructive X-ray induced graphene oxide reduction. / Mikoushkin, V. M.; Kriukov, A. S.; Nikonov, S. Yu; Dideikin, A. T.; Vul, A. Ya; Vilkov, O. Yu.
In: Journal of Applied Physics, Vol. 124, No. 17, 175303, 2018.Research output: Contribution to journal › Article › peer-review
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TY - JOUR
T1 - Non-thermal and low-destructive X-ray induced graphene oxide reduction
AU - Mikoushkin, V. M.
AU - Kriukov, A. S.
AU - Nikonov, S. Yu
AU - Dideikin, A. T.
AU - Vul, A. Ya
AU - Vilkov, O. Yu
PY - 2018
Y1 - 2018
N2 - Large-scale graphene fabrication by thermal and chemical reductions of graphene oxide has faced the problem of defect formation. To solve the problem, we have considered a physically alternative reduction process including electronic excitation followed by the oxygen group detachment from the carbon sheet without capturing a sheet of carbon atoms. Single-layer graphene oxide films were studied by photoemission spectroscopy in the course of monochromatic synchrotron X-ray radiation with in situ control of the layer thickness, chemical composition, atomic ordering, and defect concentration exactly in the modified area. The radiation flux was too low to heat the film. A non-thermal and low-destructive effect of X-ray induced graphene oxide reduction has been revealed. Transformation of the sp3 σ bonds into sp2 π ordered bonds, bandgap closing, and significant diminishing of the oxygen content (below 5 at. %) have been observed without any signs of defects in the photoemission spectra. The effective cross section of the oxygen group detachment induced by a soft X-ray photon (hν = 130 eV) was estimated to be σ∗ ∼ 3 × 10-18 cm2. A reduced single-layer graphene oxide with a narrow bandgap (0.4 - 0.8 eV) attractive for many applications was obtained, as well as almost pure graphene.
AB - Large-scale graphene fabrication by thermal and chemical reductions of graphene oxide has faced the problem of defect formation. To solve the problem, we have considered a physically alternative reduction process including electronic excitation followed by the oxygen group detachment from the carbon sheet without capturing a sheet of carbon atoms. Single-layer graphene oxide films were studied by photoemission spectroscopy in the course of monochromatic synchrotron X-ray radiation with in situ control of the layer thickness, chemical composition, atomic ordering, and defect concentration exactly in the modified area. The radiation flux was too low to heat the film. A non-thermal and low-destructive effect of X-ray induced graphene oxide reduction has been revealed. Transformation of the sp3 σ bonds into sp2 π ordered bonds, bandgap closing, and significant diminishing of the oxygen content (below 5 at. %) have been observed without any signs of defects in the photoemission spectra. The effective cross section of the oxygen group detachment induced by a soft X-ray photon (hν = 130 eV) was estimated to be σ∗ ∼ 3 × 10-18 cm2. A reduced single-layer graphene oxide with a narrow bandgap (0.4 - 0.8 eV) attractive for many applications was obtained, as well as almost pure graphene.
KW - ELECTRON-STIMULATED REDUCTION
KW - GRAPHITE OXIDE
KW - PHOTOELECTRON-SPECTROSCOPY
KW - REDUCED GRAPHENE
KW - LOW-TEMPERATURE
KW - CARBON-FILMS
KW - PHOTOREDUCTION
KW - DESORPTION
KW - SURFACE
KW - LASER
UR - http://www.scopus.com/inward/record.url?scp=85056346422&partnerID=8YFLogxK
UR - http://aip.scitation.org/doi/10.1063/1.5047045
UR - http://www.mendeley.com/research/nonthermal-lowdestructive-xray-induced-graphene-oxide-reduction-1
U2 - 10.1063/1.5047045
DO - 10.1063/1.5047045
M3 - Article
AN - SCOPUS:85056346422
VL - 124
JO - Journal of Applied Physics
JF - Journal of Applied Physics
SN - 0021-8979
IS - 17
M1 - 175303
ER -
ID: 36110165