• I. V. Sokolov
  • Ya A. Fofanov

High sensitive polarization-modulation microscopy of transparent objects with the use of single mode squeezed light and spatially multimode squeezed light is discussed. Criterion for the evaluation of threshold sensitivity and resolving power of polarization measurements is suggested.

Original languageEnglish
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsAnatoliy S. Chirkin, Sergei N. Bagayev
Pages384-388
Number of pages5
StatePublished - 1996
EventAtomic and Quantum Optics: High-Precision Measurements - St. Petersburg, Russia
Duration: 27 Jun 1995 → 1 Jul 1995

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume2799

Conference

ConferenceAtomic and Quantum Optics: High-Precision Measurements
CitySt. Petersburg, Russia
Period27/06/95 → 1/07/95

    Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

ID: 73496911