Modeling methods of the test inputs for analysis the digital devices

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research

Department of Computer Modelling and Multiprocessor Systems
Department of Control Systems Theory for Electrophysical Facilities

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DOI

https://doi.org/10.1109/Emission.2014.6893969
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V.I. Melnik
A.N. Mikhailov
V.M. Grishkin
D.A. Ovsyannikov
Y.V. Yelaev

Original language	English
Title of host publication	Modeling methods of the test inputs for analysis the digital devices
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	1-3
ISBN (Print)	9781479956074
DOIs	https://doi.org/10.1109/Emission.2014.6893969
State	Published - 2014

ID: 7029268

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Modeling methods of the test inputs for analysis the digital devices

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