Standard

Methods of modeling of the test inputs for analysis the digital devices. / Melnik, V.I.; Mikhailov, A.N.; Grishkin, V.M.; Ovsyannikov, D.A.; Yelaev, Y.V.

Methods of modeling of the test inputs for analysis the digital devices. Institute of Electrical and Electronics Engineers Inc., 2014. p. 112-113.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Harvard

Melnik, VI, Mikhailov, AN, Grishkin, VM, Ovsyannikov, DA & Yelaev, YV 2014, Methods of modeling of the test inputs for analysis the digital devices. in Methods of modeling of the test inputs for analysis the digital devices. Institute of Electrical and Electronics Engineers Inc., pp. 112-113. https://doi.org/10.1109/ICCTPEA.2014.6893309

APA

Melnik, V. I., Mikhailov, A. N., Grishkin, V. M., Ovsyannikov, D. A., & Yelaev, Y. V. (2014). Methods of modeling of the test inputs for analysis the digital devices. In Methods of modeling of the test inputs for analysis the digital devices (pp. 112-113). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICCTPEA.2014.6893309

Vancouver

Melnik VI, Mikhailov AN, Grishkin VM, Ovsyannikov DA, Yelaev YV. Methods of modeling of the test inputs for analysis the digital devices. In Methods of modeling of the test inputs for analysis the digital devices. Institute of Electrical and Electronics Engineers Inc. 2014. p. 112-113 https://doi.org/10.1109/ICCTPEA.2014.6893309

Author

Melnik, V.I. ; Mikhailov, A.N. ; Grishkin, V.M. ; Ovsyannikov, D.A. ; Yelaev, Y.V. / Methods of modeling of the test inputs for analysis the digital devices. Methods of modeling of the test inputs for analysis the digital devices. Institute of Electrical and Electronics Engineers Inc., 2014. pp. 112-113

BibTeX

@inproceedings{acc4a2c0e8374d8b85597257cda074de,
title = "Methods of modeling of the test inputs for analysis the digital devices",
author = "V.I. Melnik and A.N. Mikhailov and V.M. Grishkin and D.A. Ovsyannikov and Y.V. Yelaev",
year = "2014",
doi = "10.1109/ICCTPEA.2014.6893309",
language = "English",
isbn = "9781479953172",
pages = "112--113",
booktitle = "Methods of modeling of the test inputs for analysis the digital devices",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
address = "United States",

}

RIS

TY - GEN

T1 - Methods of modeling of the test inputs for analysis the digital devices

AU - Melnik, V.I.

AU - Mikhailov, A.N.

AU - Grishkin, V.M.

AU - Ovsyannikov, D.A.

AU - Yelaev, Y.V.

PY - 2014

Y1 - 2014

U2 - 10.1109/ICCTPEA.2014.6893309

DO - 10.1109/ICCTPEA.2014.6893309

M3 - Conference contribution

SN - 9781479953172

SP - 112

EP - 113

BT - Methods of modeling of the test inputs for analysis the digital devices

PB - Institute of Electrical and Electronics Engineers Inc.

ER -

ID: 7029304