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Interface properties of Si-SiO2-Ta2O5 structure by cathodoluminescence spectroscopy. / Baraban, A. P.; Dmitriev, V. A.; Drozd, V. E.; Prokofiev, V. A.; Samarin, S. N.; Filatova, E. O.

In: Journal of Applied Physics, Vol. 119, 2016, p. 055307-5.

Research output: Contribution to journal › Article

Harvard

Baraban, AP, Dmitriev, VA, Drozd, VE, Prokofiev, VA, Samarin, SN & Filatova, EO 2016, 'Interface properties of Si-SiO2-Ta2O5 structure by cathodoluminescence spectroscopy', Journal of Applied Physics, vol. 119, pp. 055307-5.

APA

Baraban, A. P., Dmitriev, V. A., Drozd, V. E., Prokofiev, V. A., Samarin, S. N., & Filatova, E. O. (2016). Interface properties of Si-SiO2-Ta2O5 structure by cathodoluminescence spectroscopy. Journal of Applied Physics, 119, 055307-5.

Vancouver

Baraban AP, Dmitriev VA, Drozd VE, Prokofiev VA, Samarin SN, Filatova EO. Interface properties of Si-SiO2-Ta2O5 structure by cathodoluminescence spectroscopy. Journal of Applied Physics. 2016;119:055307-5.

Author

Baraban, A. P. ; Dmitriev, V. A. ; Drozd, V. E. ; Prokofiev, V. A. ; Samarin, S. N. ; Filatova, E. O. / Interface properties of Si-SiO2-Ta2O5 structure by cathodoluminescence spectroscopy. In: Journal of Applied Physics. 2016 ; Vol. 119. pp. 055307-5.

BibTeX

@article{01dd6205461b4b8faf1fb8625eaa77d9,
title = "Interface properties of Si-SiO2-Ta2O5 structure by cathodoluminescence spectroscopy",
author = "Baraban, {A. P.} and Dmitriev, {V. A.} and Drozd, {V. E.} and Prokofiev, {V. A.} and Samarin, {S. N.} and Filatova, {E. O.}",
year = "2016",
language = "English",
volume = "119",
pages = "055307--5",
journal = "Journal of Applied Physics",
issn = "0021-8979",
publisher = "American Institute of Physics",

}

RIS

TY - JOUR

T1 - Interface properties of Si-SiO2-Ta2O5 structure by cathodoluminescence spectroscopy

AU - Baraban, A. P.

AU - Dmitriev, V. A.

AU - Drozd, V. E.

AU - Prokofiev, V. A.

AU - Samarin, S. N.

AU - Filatova, E. O.

PY - 2016

Y1 - 2016

M3 - Article

VL - 119

SP - 55307

EP - 55305

JO - Journal of Applied Physics

JF - Journal of Applied Physics

SN - 0021-8979

ER -

ID: 7553327