High-current breakdown of the quantum hall effect. / Matthews, A. J.; Kavokin, K. V.; Usher, A.; Portnoi, M. E.; Gething, J. D.; Zhu, M.; Ritchie, D. A.
PHYSICS OF SEMICONDUCTORS: 27th International Conference on the Physics of Semiconductors, ICPS-27. 2005. p. 557-558 (AIP Conference Proceedings; Vol. 772).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
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TY - GEN
T1 - High-current breakdown of the quantum hall effect
AU - Matthews, A. J.
AU - Kavokin, K. V.
AU - Usher, A.
AU - Portnoi, M. E.
AU - Gething, J. D.
AU - Zhu, M.
AU - Ritchie, D. A.
PY - 2005/6/30
Y1 - 2005/6/30
N2 - We have recently developed a model for the high-current breakdown of the integer quantum Hall effect, as measured in contactless experiments using a highly-sensitive torsion balance magnetometer. The model predicts that, for low-mobility samples, the critical current for breakdown should decrease linearly with temperature. This prediction is verified experimentally with the addition of a low-temperature (< ∼ 300 mK) saturation of the critical current. This saturation is consistent with quasi-elastic inter-Landau-level scattering when the maximum electric field in the sample reaches a large enough value. Here we extend this model to 'nearly' integer filling factors to show how the model may account for the shape of the magnetisation signal.
AB - We have recently developed a model for the high-current breakdown of the integer quantum Hall effect, as measured in contactless experiments using a highly-sensitive torsion balance magnetometer. The model predicts that, for low-mobility samples, the critical current for breakdown should decrease linearly with temperature. This prediction is verified experimentally with the addition of a low-temperature (< ∼ 300 mK) saturation of the critical current. This saturation is consistent with quasi-elastic inter-Landau-level scattering when the maximum electric field in the sample reaches a large enough value. Here we extend this model to 'nearly' integer filling factors to show how the model may account for the shape of the magnetisation signal.
UR - http://www.scopus.com/inward/record.url?scp=33749493878&partnerID=8YFLogxK
U2 - 10.1063/1.1994229
DO - 10.1063/1.1994229
M3 - Conference contribution
AN - SCOPUS:33749493878
SN - 0735402574
SN - 9780735402577
T3 - AIP Conference Proceedings
SP - 557
EP - 558
BT - PHYSICS OF SEMICONDUCTORS
T2 - PHYSICS OF SEMICONDUCTORS: 27th International Conference on the Physics of Semiconductors, ICPS-27
Y2 - 26 July 2004 through 30 July 2004
ER -
ID: 39910619