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Fluorescence analysis of a multilayer (Zr(10 nm)/[Fe(1.6 nm)/Cr(1.7 nm)]26/Cr(50 nm)/glass) structure under grazing incidence conditions. / Andreeva, M. A.; Odintsova, E. E.; Semenov, V. G.; Irkaev, S. M.; Panchuk, V. V.

In: Journal of Surface Investigation, Vol. 2, No. 4, 01.08.2008, p. 564-568.

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Andreeva, M. A. ; Odintsova, E. E. ; Semenov, V. G. ; Irkaev, S. M. ; Panchuk, V. V. / Fluorescence analysis of a multilayer (Zr(10 nm)/[Fe(1.6 nm)/Cr(1.7 nm)]26/Cr(50 nm)/glass) structure under grazing incidence conditions. In: Journal of Surface Investigation. 2008 ; Vol. 2, No. 4. pp. 564-568.

BibTeX

@article{fb9c41910a634db2a8d9ae596e999c62,
title = "Fluorescence analysis of a multilayer (Zr(10 nm)/[Fe(1.6 nm)/Cr(1.7 nm)]26/Cr(50 nm)/glass) structure under grazing incidence conditions",
abstract = "Element-specific measurements of the fluorescent radiation combined with measurements of the reflectivity curves have been performed for a Zr(10 nm)/[Fe(1.6 nm)/Cr(1.7 nm)]26/Cr(50 nm)/glass sample with the use of a new experimental setup created at the Institute for Analytical Instrumentation. The experimental data have been processed using a FLUO simulation program package implemented in the Visual C++ environment. The Zr, Fe, Cr, and Sn depth profiles have been reconstructed via coprocessing of reflectivity and fluorescence yield curves that were measured for each of these elements.",
author = "Andreeva, {M. A.} and Odintsova, {E. E.} and Semenov, {V. G.} and Irkaev, {S. M.} and Panchuk, {V. V.}",
year = "2008",
month = aug,
day = "1",
doi = "10.1134/S1027451008040125",
language = "English",
volume = "2",
pages = "564--568",
journal = "ПОВЕРХНОСТЬ. РЕНТГЕНОВСКИЕ, СИНХРОТРОННЫЕ И НЕЙТРОННЫЕ ИССЛЕДОВАНИЯ",
issn = "1027-4510",
publisher = "МАИК {"}Наука/Интерпериодика{"}",
number = "4",

}

RIS

TY - JOUR

T1 - Fluorescence analysis of a multilayer (Zr(10 nm)/[Fe(1.6 nm)/Cr(1.7 nm)]26/Cr(50 nm)/glass) structure under grazing incidence conditions

AU - Andreeva, M. A.

AU - Odintsova, E. E.

AU - Semenov, V. G.

AU - Irkaev, S. M.

AU - Panchuk, V. V.

PY - 2008/8/1

Y1 - 2008/8/1

N2 - Element-specific measurements of the fluorescent radiation combined with measurements of the reflectivity curves have been performed for a Zr(10 nm)/[Fe(1.6 nm)/Cr(1.7 nm)]26/Cr(50 nm)/glass sample with the use of a new experimental setup created at the Institute for Analytical Instrumentation. The experimental data have been processed using a FLUO simulation program package implemented in the Visual C++ environment. The Zr, Fe, Cr, and Sn depth profiles have been reconstructed via coprocessing of reflectivity and fluorescence yield curves that were measured for each of these elements.

AB - Element-specific measurements of the fluorescent radiation combined with measurements of the reflectivity curves have been performed for a Zr(10 nm)/[Fe(1.6 nm)/Cr(1.7 nm)]26/Cr(50 nm)/glass sample with the use of a new experimental setup created at the Institute for Analytical Instrumentation. The experimental data have been processed using a FLUO simulation program package implemented in the Visual C++ environment. The Zr, Fe, Cr, and Sn depth profiles have been reconstructed via coprocessing of reflectivity and fluorescence yield curves that were measured for each of these elements.

UR - http://www.scopus.com/inward/record.url?scp=58449125499&partnerID=8YFLogxK

U2 - 10.1134/S1027451008040125

DO - 10.1134/S1027451008040125

M3 - Article

AN - SCOPUS:58449125499

VL - 2

SP - 564

EP - 568

JO - ПОВЕРХНОСТЬ. РЕНТГЕНОВСКИЕ, СИНХРОТРОННЫЕ И НЕЙТРОННЫЕ ИССЛЕДОВАНИЯ

JF - ПОВЕРХНОСТЬ. РЕНТГЕНОВСКИЕ, СИНХРОТРОННЫЕ И НЕЙТРОННЫЕ ИССЛЕДОВАНИЯ

SN - 1027-4510

IS - 4

ER -

ID: 41461488