Element-specific measurements of the fluorescent radiation combined with measurements of the reflectivity curves have been performed for a Zr(10 nm)/[Fe(1.6 nm)/Cr(1.7 nm)]₂₆/Cr(50 nm)/glass sample with the use of a new experimental setup created at the Institute for Analytical Instrumentation. The experimental data have been processed using a FLUO simulation program package implemented in the Visual C++ environment. The Zr, Fe, Cr, and Sn depth profiles have been reconstructed via coprocessing of reflectivity and fluorescence yield curves that were measured for each of these elements.