DOI

The dielectric spectroscopy data contains information on both the structure and internal bonds of the material and its functional properties. Due to the principles of dielectric spectroscopy, such measurements require rather complex processing algorithms.

Original languageEnglish
Title of host publication2016 14th International Baltic Conference on Atomic Layer Deposition, BALD 2016 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages57-59
Number of pages3
ISBN (Electronic)9781509034161
DOIs
StatePublished - 24 Mar 2017
Event14th International Baltic Conference on Atomic Layer Deposition, BALD 2016 - St. Petersburg, Russian Federation
Duration: 1 Oct 2016 → 3 Oct 2016

Conference

Conference14th International Baltic Conference on Atomic Layer Deposition, BALD 2016
Country/TerritoryRussian Federation
CitySt. Petersburg
Period1/10/16 → 3/10/16

    Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Surfaces, Coatings and Films
  • Atomic and Molecular Physics, and Optics
  • Surfaces and Interfaces
  • Process Chemistry and Technology
  • Electrochemistry

ID: 9294084