Research output: Contribution to journal › Conference article › peer-review
Enhancement of laser/EUV conversion by shaped laser pulse interacting with Li-contained targets for EUV lithography. / Andreev, A. A.; Limpouch, J.; Voznesensky, N. B.; Zhevlakov, A. P.; Yashin, V. E.
In: Proceedings of SPIE - The International Society for Optical Engineering, Vol. 5196, 2004, p. 128-136.Research output: Contribution to journal › Conference article › peer-review
}
TY - JOUR
T1 - Enhancement of laser/EUV conversion by shaped laser pulse interacting with Li-contained targets for EUV lithography
AU - Andreev, A. A.
AU - Limpouch, J.
AU - Voznesensky, N. B.
AU - Zhevlakov, A. P.
AU - Yashin, V. E.
PY - 2004
Y1 - 2004
N2 - The advantages of droplet and claster Li-contained targets for debris free EUV generation are estimated on base of analytical modeling and simulation. Conversion efficiency of laser energy into EUV energy from such targets is found to reach a few percents. The laser prepulse is proposed to enhance the laser energy conversion into emission at wavelength of 13.5 nm.
AB - The advantages of droplet and claster Li-contained targets for debris free EUV generation are estimated on base of analytical modeling and simulation. Conversion efficiency of laser energy into EUV energy from such targets is found to reach a few percents. The laser prepulse is proposed to enhance the laser energy conversion into emission at wavelength of 13.5 nm.
KW - Amplifier
KW - Claster
KW - Conversion
KW - Droplet
KW - Laser produced plasma
KW - Line emission
KW - Master oscillator
KW - Nanolithography
UR - http://www.scopus.com/inward/record.url?scp=1942422141&partnerID=8YFLogxK
U2 - 10.1117/12.512456
DO - 10.1117/12.512456
M3 - Conference article
AN - SCOPUS:1942422141
VL - 5196
SP - 128
EP - 136
JO - Proceedings of SPIE - The International Society for Optical Engineering
JF - Proceedings of SPIE - The International Society for Optical Engineering
SN - 0277-786X
T2 - Laser-Generated and Other Laboratory X-Ray and EUV Sources, Optics, and Applications
Y2 - 4 August 2003 through 6 August 2003
ER -
ID: 86382080