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Energy filtration of secondary and backscattered electrons by the method of the retarding potential in scanning electron and ion microscopy. / Mikhailovskii, V.Y.; Petrov, Y.V.; Vyvenko, O.F.

In: Journal of Surface Investigation X-Ray, Synchrotron and Neutron Techniques, Vol. 9, No. 1, 2015, p. 196-202.

Research output: Contribution to journal › Article

Harvard

Mikhailovskii, VY, Petrov, YV & Vyvenko, OF 2015, 'Energy filtration of secondary and backscattered electrons by the method of the retarding potential in scanning electron and ion microscopy', Journal of Surface Investigation X-Ray, Synchrotron and Neutron Techniques, vol. 9, no. 1, pp. 196-202. https://doi.org/10.1134/S1027451014060378

APA

Mikhailovskii, V. Y., Petrov, Y. V., & Vyvenko, O. F. (2015). Energy filtration of secondary and backscattered electrons by the method of the retarding potential in scanning electron and ion microscopy. Journal of Surface Investigation X-Ray, Synchrotron and Neutron Techniques, 9(1), 196-202. https://doi.org/10.1134/S1027451014060378

Vancouver

Mikhailovskii VY, Petrov YV, Vyvenko OF. Energy filtration of secondary and backscattered electrons by the method of the retarding potential in scanning electron and ion microscopy. Journal of Surface Investigation X-Ray, Synchrotron and Neutron Techniques. 2015;9(1):196-202. https://doi.org/10.1134/S1027451014060378

Author

Mikhailovskii, V.Y. ; Petrov, Y.V. ; Vyvenko, O.F. / Energy filtration of secondary and backscattered electrons by the method of the retarding potential in scanning electron and ion microscopy. In: Journal of Surface Investigation X-Ray, Synchrotron and Neutron Techniques. 2015 ; Vol. 9, No. 1. pp. 196-202.

BibTeX

@article{ae77f2d2e85a408690de4f28533b2a1b,
title = "Energy filtration of secondary and backscattered electrons by the method of the retarding potential in scanning electron and ion microscopy",
author = "V.Y. Mikhailovskii and Y.V. Petrov and O.F. Vyvenko",
year = "2015",
doi = "10.1134/S1027451014060378",
language = "English",
volume = "9",
pages = "196--202",
journal = "ПОВЕРХНОСТЬ. РЕНТГЕНОВСКИЕ, СИНХРОТРОННЫЕ И НЕЙТРОННЫЕ ИССЛЕДОВАНИЯ",
issn = "1027-4510",
publisher = "МАИК {"}Наука/Интерпериодика{"}",
number = "1",

}

RIS

TY - JOUR

T1 - Energy filtration of secondary and backscattered electrons by the method of the retarding potential in scanning electron and ion microscopy

AU - Mikhailovskii, V.Y.

AU - Petrov, Y.V.

AU - Vyvenko, O.F.

PY - 2015

Y1 - 2015

U2 - 10.1134/S1027451014060378

DO - 10.1134/S1027451014060378

M3 - Article

VL - 9

SP - 196

EP - 202

JO - ПОВЕРХНОСТЬ. РЕНТГЕНОВСКИЕ, СИНХРОТРОННЫЕ И НЕЙТРОННЫЕ ИССЛЕДОВАНИЯ

JF - ПОВЕРХНОСТЬ. РЕНТГЕНОВСКИЕ, СИНХРОТРОННЫЕ И НЕЙТРОННЫЕ ИССЛЕДОВАНИЯ

SN - 1027-4510

IS - 1

ER -

ID: 3927572