Research output: Contribution to journal › Article › peer-review
DNA Immobilization on n-Type Silicon Surface and Electrophysical Properties of Au/DNA/(n-Si) Structures. / Sokolov, P. A.; Bazlov, N. V.; Puchkova, A. O.; Vyvenko, O. F.; Kasyanenko, N. A.
In: Protection of Metals and Physical Chemistry of Surfaces, Vol. 47, No. 5, 2011, p. 566–571.Research output: Contribution to journal › Article › peer-review
}
TY - JOUR
T1 - DNA Immobilization on n-Type Silicon Surface and Electrophysical Properties of Au/DNA/(n-Si) Structures
AU - Sokolov, P. A.
AU - Bazlov, N. V.
AU - Puchkova, A. O.
AU - Vyvenko, O. F.
AU - Kasyanenko, N. A.
PY - 2011
Y1 - 2011
U2 - DOI: 10.1134/S2070205111050170
DO - DOI: 10.1134/S2070205111050170
M3 - статья
VL - 47
SP - 566
EP - 571
JO - Protection of Metals and Physical Chemistry of Surfaces
JF - Protection of Metals and Physical Chemistry of Surfaces
SN - 2070-206X
IS - 5
ER -
ID: 5162851