Diagnostics of γ-Irradiated Si–SiO2 Structures by the Cathodoluminescence Method › SPbU Researchers Portal

Diagnostics of γ-Irradiated Si–SiO2 Structures by the Cathodoluminescence Method

Research output: Contribution to journal › Article

DOI

https://doi.org/10.1134/S1063782613130022
Other version

Original language	English
Pages (from-to)	1711-1714
Number of pages	4
Journal	Semiconductors
Volume	47
Issue number	13
DOIs	https://doi.org/10.1134/S1063782613130022
State	Published - 2013

ID: 7389907