Standard

Combined XBIC/μ-XRF/μ-XAS/DLTS investigation of chemical character and electrical properties of Cu and Ni precipitates in silicon. / Trushin, M.; Vyvenko, O.; Seifert, W.; Kittler, M.; Zizak, I.; Erko, A.; Seibt, M.; Rudolf, C.

In: Physica Status Solidi (C) Current Topics in Solid State Physics, Vol. 6, No. 8, 2009, p. 1868-1873.

Research output: Contribution to journal › Article

Harvard

Trushin, M, Vyvenko, O, Seifert, W, Kittler, M, Zizak, I, Erko, A, Seibt, M & Rudolf, C 2009, 'Combined XBIC/μ-XRF/μ-XAS/DLTS investigation of chemical character and electrical properties of Cu and Ni precipitates in silicon', Physica Status Solidi (C) Current Topics in Solid State Physics, vol. 6, no. 8, pp. 1868-1873. https://doi.org/10.1002/pssc.200881430

APA

Trushin, M., Vyvenko, O., Seifert, W., Kittler, M., Zizak, I., Erko, A., Seibt, M., & Rudolf, C. (2009). Combined XBIC/μ-XRF/μ-XAS/DLTS investigation of chemical character and electrical properties of Cu and Ni precipitates in silicon. Physica Status Solidi (C) Current Topics in Solid State Physics, 6(8), 1868-1873. https://doi.org/10.1002/pssc.200881430

Vancouver

Trushin M, Vyvenko O, Seifert W, Kittler M, Zizak I, Erko A et al. Combined XBIC/μ-XRF/μ-XAS/DLTS investigation of chemical character and electrical properties of Cu and Ni precipitates in silicon. Physica Status Solidi (C) Current Topics in Solid State Physics. 2009;6(8):1868-1873. https://doi.org/10.1002/pssc.200881430

Author

Trushin, M. ; Vyvenko, O. ; Seifert, W. ; Kittler, M. ; Zizak, I. ; Erko, A. ; Seibt, M. ; Rudolf, C. / Combined XBIC/μ-XRF/μ-XAS/DLTS investigation of chemical character and electrical properties of Cu and Ni precipitates in silicon. In: Physica Status Solidi (C) Current Topics in Solid State Physics. 2009 ; Vol. 6, No. 8. pp. 1868-1873.

BibTeX

@article{b99a454d64974e95aecaa82f343601bc,
title = "Combined XBIC/μ-XRF/μ-XAS/DLTS investigation of chemical character and electrical properties of Cu and Ni precipitates in silicon",
author = "M. Trushin and O. Vyvenko and W. Seifert and M. Kittler and I. Zizak and A. Erko and M. Seibt and C. Rudolf",
year = "2009",
doi = "10.1002/pssc.200881430",
language = "English",
volume = "6",
pages = "1868--1873",
journal = "Physica Status Solidi C: Conferences",
issn = "1862-6351",
publisher = "Wiley-Blackwell",
number = "8",

}

RIS

TY - JOUR

T1 - Combined XBIC/μ-XRF/μ-XAS/DLTS investigation of chemical character and electrical properties of Cu and Ni precipitates in silicon

AU - Trushin, M.

AU - Vyvenko, O.

AU - Seifert, W.

AU - Kittler, M.

AU - Zizak, I.

AU - Erko, A.

AU - Seibt, M.

AU - Rudolf, C.

PY - 2009

Y1 - 2009

U2 - 10.1002/pssc.200881430

DO - 10.1002/pssc.200881430

M3 - Article

VL - 6

SP - 1868

EP - 1873

JO - Physica Status Solidi C: Conferences

JF - Physica Status Solidi C: Conferences

SN - 1862-6351

IS - 8

ER -

ID: 5476900