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Capacitance transient X-ray absorption spectroscopy of semiconducting structures. / Bazlov, N.; Vyvenko, O.; Bondarenko, A.; Trushin, M.; Novikov, A.; Vinogradov, A.; Brzhezinskaya, M.; Ovsyannikov, R.

In: Superlattices and Microstructures, Vol. 45, No. 4-5, 2009, p. 190-199.

Research output: Contribution to journal › Article

Harvard

Bazlov, N, Vyvenko, O, Bondarenko, A, Trushin, M, Novikov, A, Vinogradov, A, Brzhezinskaya, M & Ovsyannikov, R 2009, 'Capacitance transient X-ray absorption spectroscopy of semiconducting structures.', Superlattices and Microstructures, vol. 45, no. 4-5, pp. 190-199. https://doi.org/DOI: 10.1016/j.spmi.2009.01.004

APA

Bazlov, N., Vyvenko, O., Bondarenko, A., Trushin, M., Novikov, A., Vinogradov, A., Brzhezinskaya, M., & Ovsyannikov, R. (2009). Capacitance transient X-ray absorption spectroscopy of semiconducting structures. Superlattices and Microstructures, 45(4-5), 190-199. https://doi.org/DOI: 10.1016/j.spmi.2009.01.004

Vancouver

Bazlov N, Vyvenko O, Bondarenko A, Trushin M, Novikov A, Vinogradov A et al. Capacitance transient X-ray absorption spectroscopy of semiconducting structures. Superlattices and Microstructures. 2009;45(4-5):190-199. https://doi.org/DOI: 10.1016/j.spmi.2009.01.004

Author

Bazlov, N. ; Vyvenko, O. ; Bondarenko, A. ; Trushin, M. ; Novikov, A. ; Vinogradov, A. ; Brzhezinskaya, M. ; Ovsyannikov, R. / Capacitance transient X-ray absorption spectroscopy of semiconducting structures. In: Superlattices and Microstructures. 2009 ; Vol. 45, No. 4-5. pp. 190-199.

BibTeX

@article{4ff1fbb18a04445292c5f515a076c6a6,
title = "Capacitance transient X-ray absorption spectroscopy of semiconducting structures.",
author = "N. Bazlov and O. Vyvenko and A. Bondarenko and M. Trushin and A. Novikov and A. Vinogradov and M. Brzhezinskaya and R. Ovsyannikov",
year = "2009",
doi = "DOI: 10.1016/j.spmi.2009.01.004",
language = "не определен",
volume = "45",
pages = "190--199",
journal = "Micro and Nanostructures",
issn = "2773-0131",
publisher = "Elsevier",
number = "4-5",

}

RIS

TY - JOUR

T1 - Capacitance transient X-ray absorption spectroscopy of semiconducting structures.

AU - Bazlov, N.

AU - Vyvenko, O.

AU - Bondarenko, A.

AU - Trushin, M.

AU - Novikov, A.

AU - Vinogradov, A.

AU - Brzhezinskaya, M.

AU - Ovsyannikov, R.

PY - 2009

Y1 - 2009

U2 - DOI: 10.1016/j.spmi.2009.01.004

DO - DOI: 10.1016/j.spmi.2009.01.004

M3 - статья

VL - 45

SP - 190

EP - 199

JO - Micro and Nanostructures

JF - Micro and Nanostructures

SN - 2773-0131

IS - 4-5

ER -

ID: 5126279