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200 and 300 Mev/nucleon nuclear reactions responsible for single-event effects in microelectronics

Research output: Contribution to journal › Article

Department of Nuclear Physics Research Methods

DOI

https://doi.org/DOI: 10.1103/PhysRevC.77.044601
Other version

H. Jäderström
Yu. Murin
Yu. Babain
M. Chubarov
V. Pljusche
M. Zubkov
P. Nomokonov
N. Olsson
J. Blomgren
U. Tippawan
L. Westerberg
P. Golubev
B. Jakobsson
L. Gerén
P.-E. Tegnér
I. Zartova
A. Budzanowski
B. Czech
I. Skwirczynska
H. H. K. Tang
J. Aichelin
Y. Watanabe
K.K. Gudima

Original language	Undefined
Pages (from-to)	044601_1-12
Journal	Physical Review C - Nuclear Physics
Volume	77
Issue number	4
DOIs	https://doi.org/DOI: 10.1103/PhysRevC.77.044601
State	Published - 2008

ID: 5274455