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  1. 2020

  2. Direct observation of amorphous to crystalline phase transitions in Ge–Sb–Te thin films by grazing incidence X-ray diffraction method

    Kozyukhin, S. A., Nikolaev, I. I., Lazarenko, P. I., Valkovskiy, G. A., Konovalov, O., Kolobov, A. V. & Grigoryeva, N. A., 1 Jul 2020, In: Journal of Materials Science: Materials in Electronics. 31, 13, p. 10196-10206 11 p.

    Research output: Contribution to journal › Article › peer-review

ID: 18596456