1. 2021
  2. 2014
  3. Interface method of digital devices testing

    Grishkin, V., Yelaev, Y., Lopatkin, G., Mikhailov, A. & Ovsyannikov, D., 2014, 2014 10th International Vacuum Electron Sources Conference, IVESC 2014 and 2nd International Conference on Emission Electronics, ICEE 2014 - Proceedings.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionResearch

  4. 2012
  5. Метод токовой диагностики радиоэлектронной аппаратуры

    Михайлов, А. Н. & Овсянников, Д. А., 2012, Издательство «ВВМ».

    Research output: Book/Report/AnthologyTeaching materialsEducation

  6. 1984
  7. BEHAVIOR OF THE ELLIPSOMETRIC PARAMETER DELTA CLOSE TO THE CRITICAL STRATIFICATION POINT OF A BINARY SOLUTION.

    Mikhailov, A. V., Kuz'min, V. L. & Rusanov, A. I., May 1984, In: Colloid journal of the USSR. 46, 3, p. 430-437 8 p.

    Research output: Contribution to journalArticlepeer-review

ID: 206041