1 - 2 out of 2Page size: 10
  1. 2007

  2. Enhancement of IR emission from a dislocation network in Si due to an external bias voltage

    Yu, X., Vyvenko, O. F., Reiche, M. & Kittler, M., Sep 2007, In: Materials Science and Engineering C. 27, 5-8 SPEC. ISS., p. 1026-1029 4 p.

    Research output: Contribution to journal › Article › peer-review

  3. Silicon nanostructures for IR light emitters

    Kittler, M., Arguirov, T., Seifert, W., Yu, X., Jia, G., Vyvenko, O. F., Mchedlidze, T., Reiche, M., Sha, J. & Yang, D., Sep 2007, In: Materials Science and Engineering C. 27, 5-8 SPEC. ISS., p. 1252-1259 8 p.

    Research output: Contribution to journal › Article › peer-review

ID: 18613104