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  1. 1983

  2. INFLUENCE OF BAND DEGENERACY AND NONPARABOLICITY ON THE MEASUREMENTS OF SURFACE EFFECTS IN SEMICONDUCTORS.

    Kapitonov, M. V., Yafyasov, A. M. & Romanov, O. V., 1 Jan 1983, In: Soviet physics. Semiconductors. 17, 5, p. 511-514 4 p.

    Research output: Contribution to journal › Article › peer-review

  3. STRAIN INDUCED EFFECTS OF DISLOCATIONS IN CdS:SHIFT OF EXCITONIC LINES. PHOTOVOLTAIC EFFECT.

    Vyvenko, O., 1 Jan 1983, In: Journal De Physique. 44, 9, p. 149-155 7 p.

    Research output: Contribution to journal › Article › peer-review

  4. 1982

  5. PARAMETERS OF THE INTERACTION BETWEEN HYDROGEN AND NICKEL.

    Afanas'eva, E. Y., Gabis, I. E. & Kurdyumov, A. A., 1 Jan 1982, In: Soviet physics. Technical physics. 27, 5, p. 585-589 5 p.

    Research output: Contribution to journal › Article › peer-review

  6. 1979

  7. EFFECT OF FLUORIDE IONS ON THE PROPERTIES OF AN SI-SiO2 STRUCTURE.

    Tarantov, Y. A., Baraban, A. P. & Konorov, P. P., 1 Jan 1979, In: Soviet Microelectronics (English Translation of Mikroelektronika). 8, 2, p. 136-137 2 p.

    Research output: Contribution to journal › Article › peer-review

  8. EFFECT OF THE POTENTIAL BARRIER SHAPE ON HOLE TRANSPORT IN A SURFACE INVERSION CHANNEL.

    Romanov, O. V. & Yafyasov, A. M., 1 Jan 1979, In: Soviet Microelectronics (English Translation of Mikroelektronika). 8, 3, p. 198-202 5 p.

    Research output: Contribution to journal › Article › peer-review

  9. FEATURES OF THE RELAXATION OF THE NONEQUILIBRIUM CAPACITANCE OF Si-SiO2 STRUCTURES IN INTENSE ELECTRIC FIELDS.

    Baraban, A. P. & Tarantov, Y. A., 1 Jan 1979, In: Soviet Microelectronics (English Translation of Mikroelektronika). 8, 4, p. 285-286 2 p.

    Research output: Contribution to journal › Article › peer-review

  10. 1976

  11. INFLUENCE OF ION IMPLANTATION ON SURFACE TRANSPORT OF CARRIERS IN SILICON.

    Romanov, O. V., Uritskii, V. Y. & Yafyasov, A. M., 1976, In: Sov Phys Semicond. 10, 2, p. 198-201 4 p.

    Research output: Contribution to journal › Article › peer-review

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