Standard

X-ray photoelectron spectroscopy for nondestructive analysis of buried interfaces. / Filatova, E. O.; Sokolov, A. A.

в: Journal of Structural Chemistry, Том 52, № Supplement 1, 2011, стр. 82-89.

Результаты исследований: Научные публикации в периодических изданиях › статья

Harvard

Filatova, EO & Sokolov, AA 2011, 'X-ray photoelectron spectroscopy for nondestructive analysis of buried interfaces', Journal of Structural Chemistry, Том. 52, № Supplement 1, стр. 82-89. https://doi.org/10.1134/S0022476611070122

APA

Filatova, E. O., & Sokolov, A. A. (2011). X-ray photoelectron spectroscopy for nondestructive analysis of buried interfaces. Journal of Structural Chemistry, 52(Supplement 1), 82-89. https://doi.org/10.1134/S0022476611070122

Vancouver

Filatova EO, Sokolov AA. X-ray photoelectron spectroscopy for nondestructive analysis of buried interfaces. Journal of Structural Chemistry. 2011;52(Supplement 1):82-89. https://doi.org/10.1134/S0022476611070122

Author

Filatova, E. O. ; Sokolov, A. A. / X-ray photoelectron spectroscopy for nondestructive analysis of buried interfaces. в: Journal of Structural Chemistry. 2011 ; Том 52, № Supplement 1. стр. 82-89.

BibTeX

@article{9342ea08e3a4401092c13f9edb3b747e,
title = "X-ray photoelectron spectroscopy for nondestructive analysis of buried interfaces",
author = "Filatova, {E. O.} and Sokolov, {A. A.}",
year = "2011",
doi = "10.1134/S0022476611070122",
language = "English",
volume = "52",
pages = "82--89",
journal = "Journal of Structural Chemistry",
issn = "0022-4766",
publisher = "Springer Nature",
number = "Supplement 1",

}

RIS

TY - JOUR

T1 - X-ray photoelectron spectroscopy for nondestructive analysis of buried interfaces

AU - Filatova, E. O.

AU - Sokolov, A. A.

PY - 2011

Y1 - 2011

U2 - 10.1134/S0022476611070122

DO - 10.1134/S0022476611070122

M3 - Article

VL - 52

SP - 82

EP - 89

JO - Journal of Structural Chemistry

JF - Journal of Structural Chemistry

SN - 0022-4766

IS - Supplement 1

ER -

ID: 5403998