Standard

X-ray analysis and computer simulation for grain size determination in nanostructured materials. / Alexandrov, I. V.; Enikeev, N. A.

в: Materials Science and Engineering A, Том 286, № 1, 30.06.2000, стр. 110-114.

Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование

Harvard

Alexandrov, IV & Enikeev, NA 2000, 'X-ray analysis and computer simulation for grain size determination in nanostructured materials', Materials Science and Engineering A, Том. 286, № 1, стр. 110-114. https://doi.org/10.1016/S0921-5093(00)00652-3

APA

Alexandrov, I. V., & Enikeev, N. A. (2000). X-ray analysis and computer simulation for grain size determination in nanostructured materials. Materials Science and Engineering A, 286(1), 110-114. https://doi.org/10.1016/S0921-5093(00)00652-3

Vancouver

Alexandrov IV, Enikeev NA. X-ray analysis and computer simulation for grain size determination in nanostructured materials. Materials Science and Engineering A. 2000 Июнь 30;286(1):110-114. https://doi.org/10.1016/S0921-5093(00)00652-3

Author

Alexandrov, I. V. ; Enikeev, N. A. / X-ray analysis and computer simulation for grain size determination in nanostructured materials. в: Materials Science and Engineering A. 2000 ; Том 286, № 1. стр. 110-114.

BibTeX

@article{5b882f773fd448dab133acebc0121b00,
title = "X-ray analysis and computer simulation for grain size determination in nanostructured materials",
abstract = "The problems of detailed X-ray characterization of pure nanostructured materials subjected to severe plastic deformation, namely large plastic deformation under applied high pressure without decomposition of a sample, are considered. Computer simulation has been used to interpret obtained experimental results. An analysis of applicability of various X-ray methods for determination of grain size in nanostructured materials has been carried out. Possible dislocation configurations responsible for specific defect structure formation due to severe plastic deformation have been determined.",
keywords = "Nanostructured materials, Severe plastic deformation, X-ray analysis",
author = "Alexandrov, {I. V.} and Enikeev, {N. A.}",
year = "2000",
month = jun,
day = "30",
doi = "10.1016/S0921-5093(00)00652-3",
language = "English",
volume = "286",
pages = "110--114",
journal = "Materials Science and Engineering: A",
issn = "0921-5093",
publisher = "Elsevier",
number = "1",

}

RIS

TY - JOUR

T1 - X-ray analysis and computer simulation for grain size determination in nanostructured materials

AU - Alexandrov, I. V.

AU - Enikeev, N. A.

PY - 2000/6/30

Y1 - 2000/6/30

N2 - The problems of detailed X-ray characterization of pure nanostructured materials subjected to severe plastic deformation, namely large plastic deformation under applied high pressure without decomposition of a sample, are considered. Computer simulation has been used to interpret obtained experimental results. An analysis of applicability of various X-ray methods for determination of grain size in nanostructured materials has been carried out. Possible dislocation configurations responsible for specific defect structure formation due to severe plastic deformation have been determined.

AB - The problems of detailed X-ray characterization of pure nanostructured materials subjected to severe plastic deformation, namely large plastic deformation under applied high pressure without decomposition of a sample, are considered. Computer simulation has been used to interpret obtained experimental results. An analysis of applicability of various X-ray methods for determination of grain size in nanostructured materials has been carried out. Possible dislocation configurations responsible for specific defect structure formation due to severe plastic deformation have been determined.

KW - Nanostructured materials

KW - Severe plastic deformation

KW - X-ray analysis

UR - http://www.scopus.com/inward/record.url?scp=0040952990&partnerID=8YFLogxK

U2 - 10.1016/S0921-5093(00)00652-3

DO - 10.1016/S0921-5093(00)00652-3

M3 - Article

AN - SCOPUS:0040952990

VL - 286

SP - 110

EP - 114

JO - Materials Science and Engineering: A

JF - Materials Science and Engineering: A

SN - 0921-5093

IS - 1

ER -

ID: 45791979