Standard

Using the statistical probability-based model of an irregular mixed-layer structure for describing the real structures of chemically nonhomogeneous single crystals. / Ivanova, T. I.; Frank-Kamenetskaya, O. V.

в: Journal of Structural Chemistry, Том 42, № 1, 01.01.2001, стр. 126-143.

Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование

Harvard

Ivanova, TI & Frank-Kamenetskaya, OV 2001, 'Using the statistical probability-based model of an irregular mixed-layer structure for describing the real structures of chemically nonhomogeneous single crystals', Journal of Structural Chemistry, Том. 42, № 1, стр. 126-143. https://doi.org/10.1023/A:1010436509516

APA

Ivanova, T. I., & Frank-Kamenetskaya, O. V. (2001). Using the statistical probability-based model of an irregular mixed-layer structure for describing the real structures of chemically nonhomogeneous single crystals. Journal of Structural Chemistry, 42(1), 126-143. https://doi.org/10.1023/A:1010436509516

Vancouver

Ivanova TI, Frank-Kamenetskaya OV. Using the statistical probability-based model of an irregular mixed-layer structure for describing the real structures of chemically nonhomogeneous single crystals. Journal of Structural Chemistry. 2001 Янв. 1;42(1):126-143. https://doi.org/10.1023/A:1010436509516

Author

Ivanova, T. I. ; Frank-Kamenetskaya, O. V. / Using the statistical probability-based model of an irregular mixed-layer structure for describing the real structures of chemically nonhomogeneous single crystals. в: Journal of Structural Chemistry. 2001 ; Том 42, № 1. стр. 126-143.

BibTeX

@article{aeef03c53e5d406db0d54afeb86d9e61,
title = "Using the statistical probability-based model of an irregular mixed-layer structure for describing the real structures of chemically nonhomogeneous single crystals",
abstract = "This paper discusses the theoretical and experimental aspects of modeling of irregular mixed-layer structures of chemically nonhomogeneous single crystals based on X-ray diffraction data. The available data on natural and synthetic single crystals of different structural types belonging to different polysomatic and isomorphic series are reviewed. Two basic types of structure are described, and criteria for their diagnostics by diffraction patterns are formulated. The range of substances to which this approach is applicable is analyzed. It is shown on particular examples that the statistical probability-based model of an irregular mixed-layer structure is applicable to quantitative description of lamellar isomorphism, fine oscillation zoning, decay structures of solid solutions, and nonhomogeneous organic thin film structures.",
author = "Ivanova, {T. I.} and Frank-Kamenetskaya, {O. V.}",
year = "2001",
month = jan,
day = "1",
doi = "10.1023/A:1010436509516",
language = "English",
volume = "42",
pages = "126--143",
journal = "Journal of Structural Chemistry",
issn = "0022-4766",
publisher = "Springer Nature",
number = "1",

}

RIS

TY - JOUR

T1 - Using the statistical probability-based model of an irregular mixed-layer structure for describing the real structures of chemically nonhomogeneous single crystals

AU - Ivanova, T. I.

AU - Frank-Kamenetskaya, O. V.

PY - 2001/1/1

Y1 - 2001/1/1

N2 - This paper discusses the theoretical and experimental aspects of modeling of irregular mixed-layer structures of chemically nonhomogeneous single crystals based on X-ray diffraction data. The available data on natural and synthetic single crystals of different structural types belonging to different polysomatic and isomorphic series are reviewed. Two basic types of structure are described, and criteria for their diagnostics by diffraction patterns are formulated. The range of substances to which this approach is applicable is analyzed. It is shown on particular examples that the statistical probability-based model of an irregular mixed-layer structure is applicable to quantitative description of lamellar isomorphism, fine oscillation zoning, decay structures of solid solutions, and nonhomogeneous organic thin film structures.

AB - This paper discusses the theoretical and experimental aspects of modeling of irregular mixed-layer structures of chemically nonhomogeneous single crystals based on X-ray diffraction data. The available data on natural and synthetic single crystals of different structural types belonging to different polysomatic and isomorphic series are reviewed. Two basic types of structure are described, and criteria for their diagnostics by diffraction patterns are formulated. The range of substances to which this approach is applicable is analyzed. It is shown on particular examples that the statistical probability-based model of an irregular mixed-layer structure is applicable to quantitative description of lamellar isomorphism, fine oscillation zoning, decay structures of solid solutions, and nonhomogeneous organic thin film structures.

UR - http://www.scopus.com/inward/record.url?scp=0035597574&partnerID=8YFLogxK

U2 - 10.1023/A:1010436509516

DO - 10.1023/A:1010436509516

M3 - Article

AN - SCOPUS:0035597574

VL - 42

SP - 126

EP - 143

JO - Journal of Structural Chemistry

JF - Journal of Structural Chemistry

SN - 0022-4766

IS - 1

ER -

ID: 49776222