Документы

DOI

  • D. Schmidt
  • B. Berger
  • M. Kahlert
  • M. Bayer
  • C. Schneider
  • S. Höfling
  • E. S. Sedov
  • A. V. Kavokin
  • M. Assmann
Dark excitons are of fundamental importance for a wide variety of processes in semiconductors but are difficult to investigate using optical techniques due to their weak interaction with light fields.We reveal and characterize dark excitons nonresonantly injected into a semiconductor microcavity structure containing
InGaAs=GaAs quantum wells by a gated train of eight 100 fs pulses separated by 13 ns by monitoring their interactions with the bright lower polariton mode.We find a surprisingly long dark exciton lifetime of more than 20 ns, which is longer than the time delay between two consecutive pulses. This creates a memory effect that we clearly observe through the variation of the time-resolved transmission signal. We propose a rate equation model that provides a quantitative agreement with the experimental data.
Язык оригиналаанглийский
Номер статьи047403
Число страниц6
ЖурналPhysical Review Letters
Том122
Номер выпуска4
DOI
СостояниеОпубликовано - 1 фев 2019

    Предметные области Scopus

  • Физика и астрономия (все)

ID: 49361595