A time-resolving technique is proposed for studying promising crystalline materials for components of micro- and optoelectronic devices under conditions of external mechanical loading using a specially designed X-ray acoustic diffractometer. The technique makes it possible to carry out fast (up to milliseconds) measurements of diffraction reflection curves of the crystals under study using a special module to create a uniaxial mechanical load. The possibility of researching reversible and irreversible processes occurring in crystals under external influences is shown, which can be used for diagnostics and predicting the fault tolerance of electronic components made on their basis.