Theoretical and Experimental Evaluation of the Electrical Parameters of a Holographic Microscope

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Theoretical and Experimental Evaluation of the Electrical Parameters of a Holographic Microscope. / Egorov, N. V.; Antonova, L. I.; Karpov, A. G.; Trofimov, V. V.; Fedorov, A. G.

в: Journal of Surface Investigation, Том 14, № 5, 01.09.2020, стр. 1061-1065.

Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование

BibTeX

@article{6878087f301e42f6a1b2f109cc4a5091,

title = "Theoretical and Experimental Evaluation of the Electrical Parameters of a Holographic Microscope",

abstract = "Abstract: The presented system for the theoretical and experimental evaluation of images obtained in a holographic microscope can be directly used for the diagnostics of industrial products during the manufacturing process. It is found that controlling the positioning of the cathode–research object in a holographic microscope can be effectively carried out by monitoring the substrate current. The resolution of the coordinate-sensitive detector of the microscope is calculated to be 400−0.4 nm. It is shown that continuous monitoring of the conditions of experimental research is necessary to obtain an informative image because each object under study is essentially unique. Test studies of thin aluminum films are performed.",

keywords = "electron in-line holography, holographic microscope, investigation of the three-dimensional atomic structure, investigation of thin films",

author = "Egorov, {N. V.} and Antonova, {L. I.} and Karpov, {A. G.} and Trofimov, {V. V.} and Fedorov, {A. G.}",

year = "2020",

month = sep,

day = "1",

doi = "10.1134/S1027451020050250",

language = "English",

volume = "14",

pages = "1061--1065",

journal = "ПОВЕРХНОСТЬ. РЕНТГЕНОВСКИЕ, СИНХРОТРОННЫЕ И НЕЙТРОННЫЕ ИССЛЕДОВАНИЯ",

issn = "1027-4510",

publisher = "МАИК {"}Наука/Интерпериодика{"}",

number = "5",

}

RIS

TY - JOUR

T1 - Theoretical and Experimental Evaluation of the Electrical Parameters of a Holographic Microscope

AU - Egorov, N. V.

AU - Antonova, L. I.

AU - Karpov, A. G.

AU - Trofimov, V. V.

AU - Fedorov, A. G.

PY - 2020/9/1

Y1 - 2020/9/1

N2 - Abstract: The presented system for the theoretical and experimental evaluation of images obtained in a holographic microscope can be directly used for the diagnostics of industrial products during the manufacturing process. It is found that controlling the positioning of the cathode–research object in a holographic microscope can be effectively carried out by monitoring the substrate current. The resolution of the coordinate-sensitive detector of the microscope is calculated to be 400−0.4 nm. It is shown that continuous monitoring of the conditions of experimental research is necessary to obtain an informative image because each object under study is essentially unique. Test studies of thin aluminum films are performed.

AB - Abstract: The presented system for the theoretical and experimental evaluation of images obtained in a holographic microscope can be directly used for the diagnostics of industrial products during the manufacturing process. It is found that controlling the positioning of the cathode–research object in a holographic microscope can be effectively carried out by monitoring the substrate current. The resolution of the coordinate-sensitive detector of the microscope is calculated to be 400−0.4 nm. It is shown that continuous monitoring of the conditions of experimental research is necessary to obtain an informative image because each object under study is essentially unique. Test studies of thin aluminum films are performed.

KW - electron in-line holography

KW - holographic microscope

KW - investigation of the three-dimensional atomic structure

KW - investigation of thin films

UR - http://www.scopus.com/inward/record.url?scp=85092785624&partnerID=8YFLogxK

U2 - 10.1134/S1027451020050250

DO - 10.1134/S1027451020050250

M3 - Article

AN - SCOPUS:85092785624

VL - 14

SP - 1061

EP - 1065

JO - ПОВЕРХНОСТЬ. РЕНТГЕНОВСКИЕ, СИНХРОТРОННЫЕ И НЕЙТРОННЫЕ ИССЛЕДОВАНИЯ

JF - ПОВЕРХНОСТЬ. РЕНТГЕНОВСКИЕ, СИНХРОТРОННЫЕ И НЕЙТРОННЫЕ ИССЛЕДОВАНИЯ

SN - 1027-4510

IS - 5

ER -

ID: 70170122