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The structure of field-induced near-wall charged layers arising in weakly conducting liquids near the surface of solid dielectrics. / Стишков, Юрий Константинович; Васильков, Сергей Андреевич; Нечаев, Дмитрий Андреевич.

в: Journal of Electrostatics, Том 94, 08.2018, стр. 44-50.

Результаты исследований: Научные публикации в периодических изданияхстатьяРецензирование

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@article{2db0694da24443c882c19967382cedf3,
title = "The structure of field-induced near-wall charged layers arising in weakly conducting liquids near the surface of solid dielectrics",
abstract = "The present paper investigates space charge formation that occurs near the surface of a solid dielectric in a weakly conducting liquid and takes place under the action of the strong external electric field and due to constant dissociation. The cases of 1D and a more complex 2D macro scale geometries are studied numerically using Comsol Multiphysics software. In the general case, the charge accumulates in a diffuse layer and can get in the bulk in consequence of its transport along the dielectric surface; and there is also a dissociation-recombination layer of ion deficit (same as in the electrohydrodynamic conduction pumping).",
keywords = "Charge transport, Diffuse layer, Heterocharge layer, Low-conducting liquid, Solid dielectric surface, Strong electric field",
author = "Стишков, {Юрий Константинович} and Васильков, {Сергей Андреевич} and Нечаев, {Дмитрий Андреевич}",
note = "Funding Information: Research was carried out using computer resources provided by Research Park of St. Petersburg State University: Resource Center “Computer Center of SPbU”. This research did not receive any specific grant from funding agencies in the public, commercial, or not-for-profit sectors.",
year = "2018",
month = aug,
doi = "10.1016/j.elstat.2018.06.002",
language = "English",
volume = "94",
pages = "44--50",
journal = "Journal of Electrostatics",
issn = "0304-3886",
publisher = "Elsevier",

}

RIS

TY - JOUR

T1 - The structure of field-induced near-wall charged layers arising in weakly conducting liquids near the surface of solid dielectrics

AU - Стишков, Юрий Константинович

AU - Васильков, Сергей Андреевич

AU - Нечаев, Дмитрий Андреевич

N1 - Funding Information: Research was carried out using computer resources provided by Research Park of St. Petersburg State University: Resource Center “Computer Center of SPbU”. This research did not receive any specific grant from funding agencies in the public, commercial, or not-for-profit sectors.

PY - 2018/8

Y1 - 2018/8

N2 - The present paper investigates space charge formation that occurs near the surface of a solid dielectric in a weakly conducting liquid and takes place under the action of the strong external electric field and due to constant dissociation. The cases of 1D and a more complex 2D macro scale geometries are studied numerically using Comsol Multiphysics software. In the general case, the charge accumulates in a diffuse layer and can get in the bulk in consequence of its transport along the dielectric surface; and there is also a dissociation-recombination layer of ion deficit (same as in the electrohydrodynamic conduction pumping).

AB - The present paper investigates space charge formation that occurs near the surface of a solid dielectric in a weakly conducting liquid and takes place under the action of the strong external electric field and due to constant dissociation. The cases of 1D and a more complex 2D macro scale geometries are studied numerically using Comsol Multiphysics software. In the general case, the charge accumulates in a diffuse layer and can get in the bulk in consequence of its transport along the dielectric surface; and there is also a dissociation-recombination layer of ion deficit (same as in the electrohydrodynamic conduction pumping).

KW - Charge transport

KW - Diffuse layer

KW - Heterocharge layer

KW - Low-conducting liquid

KW - Solid dielectric surface

KW - Strong electric field

UR - http://www.scopus.com/inward/record.url?scp=85048727269&partnerID=8YFLogxK

U2 - 10.1016/j.elstat.2018.06.002

DO - 10.1016/j.elstat.2018.06.002

M3 - Article

VL - 94

SP - 44

EP - 50

JO - Journal of Electrostatics

JF - Journal of Electrostatics

SN - 0304-3886

ER -

ID: 36818067