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The microstructure-strength relationship in severely-deformed commercial-purity titanium. / Dyakonov, G. S.; Mironov, S.; Semenova, I. P.; Valiev, R. Z.; Semiatin, S. L.

в: Materials Letters, Том 192, 01.04.2017, стр. 165-168.

Результаты исследований: Научные публикации в периодических изданияхстатьяРецензирование

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Dyakonov, G. S. ; Mironov, S. ; Semenova, I. P. ; Valiev, R. Z. ; Semiatin, S. L. / The microstructure-strength relationship in severely-deformed commercial-purity titanium. в: Materials Letters. 2017 ; Том 192. стр. 165-168.

BibTeX

@article{22342a3c968b4ae8a740adf9c3cf79f1,
title = "The microstructure-strength relationship in severely-deformed commercial-purity titanium",
abstract = "Electron backscatter diffraction was applied to examine the microstructure developed in commercial-purity titanium subjected to equal channel angular pressing at 200 °C to a true strain of 8.4. The microstructure was characterized by a mean grain size of 0.4 μm and fraction of high-angle boundaries of 55%. However, it also contained a significant fraction of relatively coarse (>1 μm) remnants of original grains. A microstructure-properties analysis indicated that strengthening effect of ECAP was essentially contributed by substructure.",
keywords = "Electron back-scatter diffraction, Equal channel angular pressing, Metals and alloys, Microstructure-strength relationship, Nanocrystalline materials",
author = "Dyakonov, {G. S.} and S. Mironov and Semenova, {I. P.} and Valiev, {R. Z.} and Semiatin, {S. L.}",
year = "2017",
month = apr,
day = "1",
doi = "10.1016/j.matlet.2016.12.032",
language = "English",
volume = "192",
pages = "165--168",
journal = "Materials Letters",
issn = "0167-577X",
publisher = "Elsevier",

}

RIS

TY - JOUR

T1 - The microstructure-strength relationship in severely-deformed commercial-purity titanium

AU - Dyakonov, G. S.

AU - Mironov, S.

AU - Semenova, I. P.

AU - Valiev, R. Z.

AU - Semiatin, S. L.

PY - 2017/4/1

Y1 - 2017/4/1

N2 - Electron backscatter diffraction was applied to examine the microstructure developed in commercial-purity titanium subjected to equal channel angular pressing at 200 °C to a true strain of 8.4. The microstructure was characterized by a mean grain size of 0.4 μm and fraction of high-angle boundaries of 55%. However, it also contained a significant fraction of relatively coarse (>1 μm) remnants of original grains. A microstructure-properties analysis indicated that strengthening effect of ECAP was essentially contributed by substructure.

AB - Electron backscatter diffraction was applied to examine the microstructure developed in commercial-purity titanium subjected to equal channel angular pressing at 200 °C to a true strain of 8.4. The microstructure was characterized by a mean grain size of 0.4 μm and fraction of high-angle boundaries of 55%. However, it also contained a significant fraction of relatively coarse (>1 μm) remnants of original grains. A microstructure-properties analysis indicated that strengthening effect of ECAP was essentially contributed by substructure.

KW - Electron back-scatter diffraction

KW - Equal channel angular pressing

KW - Metals and alloys

KW - Microstructure-strength relationship

KW - Nanocrystalline materials

UR - http://www.scopus.com/inward/record.url?scp=85009442993&partnerID=8YFLogxK

U2 - 10.1016/j.matlet.2016.12.032

DO - 10.1016/j.matlet.2016.12.032

M3 - Article

VL - 192

SP - 165

EP - 168

JO - Materials Letters

JF - Materials Letters

SN - 0167-577X

ER -

ID: 7612630