Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование
The influence of the shape and elastic strains of quantum dots on diffuse X-ray scattering. / Punegov, V. I.; Sivkov, D. V.
в: Technical Physics Letters, Том 39, № 11, 20.12.2013, стр. 964-968.Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование
}
TY - JOUR
T1 - The influence of the shape and elastic strains of quantum dots on diffuse X-ray scattering
AU - Punegov, V. I.
AU - Sivkov, D. V.
PY - 2013/12/20
Y1 - 2013/12/20
N2 - The influence of the shape and elastic-strain fields of buried quantum dots (QDs) on the angular distribution of diffuse X-ray scattering is studied. Elastic lattice displacements were calculated using the Green function method. Diffuse scattering from a semiconductor matrix with QDs having the shape of a cylinder, truncated cone, and spheroid was numerically simulated. It is shown that angular distributions of diffuse scattering for QDs with different shapes have significant distinctions at a small volume density of nanostructures in the crystal. At a large QD density, which is typical for superlattices, these distinctions become weak.
AB - The influence of the shape and elastic-strain fields of buried quantum dots (QDs) on the angular distribution of diffuse X-ray scattering is studied. Elastic lattice displacements were calculated using the Green function method. Diffuse scattering from a semiconductor matrix with QDs having the shape of a cylinder, truncated cone, and spheroid was numerically simulated. It is shown that angular distributions of diffuse scattering for QDs with different shapes have significant distinctions at a small volume density of nanostructures in the crystal. At a large QD density, which is typical for superlattices, these distinctions become weak.
UR - http://www.scopus.com/inward/record.url?scp=84890346929&partnerID=8YFLogxK
U2 - 10.1134/S1063785013110102
DO - 10.1134/S1063785013110102
M3 - Article
AN - SCOPUS:84890346929
VL - 39
SP - 964
EP - 968
JO - Technical Physics Letters
JF - Technical Physics Letters
SN - 1063-7850
IS - 11
ER -
ID: 43104659