Результаты исследований: Публикации в книгах, отчётах, сборниках, трудах конференций › статья в сборнике материалов конференции › научная › Рецензирование
The correlation and dynamic properties of smectic-A films on a substrate. / Ul'yanov, S. V.
DD 2002 - International Seminar Day on Diffraction 2002, Proceedings. ред. / I.V. Andronov. Institute of Electrical and Electronics Engineers Inc., 2002. стр. 122-132 1177900 (DD 2002 - International Seminar Day on Diffraction 2002, Proceedings).Результаты исследований: Публикации в книгах, отчётах, сборниках, трудах конференций › статья в сборнике материалов конференции › научная › Рецензирование
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TY - GEN
T1 - The correlation and dynamic properties of smectic-A films on a substrate
AU - Ul'yanov, S. V.
N1 - Publisher Copyright: © 2002 Day on Diffraction Fac of Physics SPbU. Copyright: Copyright 2018 Elsevier B.V., All rights reserved.
PY - 2002
Y1 - 2002
N2 - The dynamic properties and layer displacement-layer displacement correlation functions of the smectic-A films on a substrate are investigated. The eigenfrequencies spectrum and eigenmotions of the film are calculated within the framework of a discrete model. The effect of thermal fluctuations on the specular and diffuse X-ray scattering were analyzed.
AB - The dynamic properties and layer displacement-layer displacement correlation functions of the smectic-A films on a substrate are investigated. The eigenfrequencies spectrum and eigenmotions of the film are calculated within the framework of a discrete model. The effect of thermal fluctuations on the specular and diffuse X-ray scattering were analyzed.
UR - http://www.scopus.com/inward/record.url?scp=84969951811&partnerID=8YFLogxK
U2 - 10.1109/DD.2002.1177900
DO - 10.1109/DD.2002.1177900
M3 - Conference contribution
AN - SCOPUS:84969951811
T3 - DD 2002 - International Seminar Day on Diffraction 2002, Proceedings
SP - 122
EP - 132
BT - DD 2002 - International Seminar Day on Diffraction 2002, Proceedings
A2 - Andronov, I.V.
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - International Seminar Day on Diffraction, DD 2002
Y2 - 5 June 2002 through 8 June 2002
ER -
ID: 76496839