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The correlation and dynamic properties of smectic-A films on a substrate. / Ul'yanov, S. V.

DD 2002 - International Seminar Day on Diffraction 2002, Proceedings. ред. / I.V. Andronov. Institute of Electrical and Electronics Engineers Inc., 2002. стр. 122-132 1177900 (DD 2002 - International Seminar Day on Diffraction 2002, Proceedings).

Результаты исследований: Публикации в книгах, отчётах, сборниках, трудах конференцийстатья в сборнике материалов конференциинаучнаяРецензирование

Harvard

Ul'yanov, SV 2002, The correlation and dynamic properties of smectic-A films on a substrate. в IV Andronov (ред.), DD 2002 - International Seminar Day on Diffraction 2002, Proceedings., 1177900, DD 2002 - International Seminar Day on Diffraction 2002, Proceedings, Institute of Electrical and Electronics Engineers Inc., стр. 122-132, International Seminar Day on Diffraction, DD 2002, St. Petersburg, Российская Федерация, 5/06/02. https://doi.org/10.1109/DD.2002.1177900

APA

Ul'yanov, S. V. (2002). The correlation and dynamic properties of smectic-A films on a substrate. в I. V. Andronov (Ред.), DD 2002 - International Seminar Day on Diffraction 2002, Proceedings (стр. 122-132). [1177900] (DD 2002 - International Seminar Day on Diffraction 2002, Proceedings). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/DD.2002.1177900

Vancouver

Ul'yanov SV. The correlation and dynamic properties of smectic-A films on a substrate. в Andronov IV, Редактор, DD 2002 - International Seminar Day on Diffraction 2002, Proceedings. Institute of Electrical and Electronics Engineers Inc. 2002. стр. 122-132. 1177900. (DD 2002 - International Seminar Day on Diffraction 2002, Proceedings). https://doi.org/10.1109/DD.2002.1177900

Author

Ul'yanov, S. V. / The correlation and dynamic properties of smectic-A films on a substrate. DD 2002 - International Seminar Day on Diffraction 2002, Proceedings. Редактор / I.V. Andronov. Institute of Electrical and Electronics Engineers Inc., 2002. стр. 122-132 (DD 2002 - International Seminar Day on Diffraction 2002, Proceedings).

BibTeX

@inproceedings{8b0f9c365f9748768aa1d461195513c3,
title = "The correlation and dynamic properties of smectic-A films on a substrate",
abstract = "The dynamic properties and layer displacement-layer displacement correlation functions of the smectic-A films on a substrate are investigated. The eigenfrequencies spectrum and eigenmotions of the film are calculated within the framework of a discrete model. The effect of thermal fluctuations on the specular and diffuse X-ray scattering were analyzed.",
author = "Ul'yanov, {S. V.}",
note = "Publisher Copyright: {\textcopyright} 2002 Day on Diffraction Fac of Physics SPbU. Copyright: Copyright 2018 Elsevier B.V., All rights reserved.; International Seminar Day on Diffraction, DD 2002 ; Conference date: 05-06-2002 Through 08-06-2002",
year = "2002",
doi = "10.1109/DD.2002.1177900",
language = "English",
series = "DD 2002 - International Seminar Day on Diffraction 2002, Proceedings",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "122--132",
editor = "I.V. Andronov",
booktitle = "DD 2002 - International Seminar Day on Diffraction 2002, Proceedings",
address = "United States",

}

RIS

TY - GEN

T1 - The correlation and dynamic properties of smectic-A films on a substrate

AU - Ul'yanov, S. V.

N1 - Publisher Copyright: © 2002 Day on Diffraction Fac of Physics SPbU. Copyright: Copyright 2018 Elsevier B.V., All rights reserved.

PY - 2002

Y1 - 2002

N2 - The dynamic properties and layer displacement-layer displacement correlation functions of the smectic-A films on a substrate are investigated. The eigenfrequencies spectrum and eigenmotions of the film are calculated within the framework of a discrete model. The effect of thermal fluctuations on the specular and diffuse X-ray scattering were analyzed.

AB - The dynamic properties and layer displacement-layer displacement correlation functions of the smectic-A films on a substrate are investigated. The eigenfrequencies spectrum and eigenmotions of the film are calculated within the framework of a discrete model. The effect of thermal fluctuations on the specular and diffuse X-ray scattering were analyzed.

UR - http://www.scopus.com/inward/record.url?scp=84969951811&partnerID=8YFLogxK

U2 - 10.1109/DD.2002.1177900

DO - 10.1109/DD.2002.1177900

M3 - Conference contribution

AN - SCOPUS:84969951811

T3 - DD 2002 - International Seminar Day on Diffraction 2002, Proceedings

SP - 122

EP - 132

BT - DD 2002 - International Seminar Day on Diffraction 2002, Proceedings

A2 - Andronov, I.V.

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - International Seminar Day on Diffraction, DD 2002

Y2 - 5 June 2002 through 8 June 2002

ER -

ID: 76496839