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Surface self-organization in multilayer film coatings. / Shuvalov, Gleb M.; Kostyrko, Sergey A.

в: AIP Conference Proceedings, Том 1909, 01.12.2017, стр. 020196-1-020196-4.

Результаты исследований: Научные публикации в периодических изданияхстатьяРецензирование

Harvard

Shuvalov, GM & Kostyrko, SA 2017, 'Surface self-organization in multilayer film coatings', AIP Conference Proceedings, Том. 1909, стр. 020196-1-020196-4. https://doi.org/10.1063/1.5013877

APA

Vancouver

Author

Shuvalov, Gleb M. ; Kostyrko, Sergey A. / Surface self-organization in multilayer film coatings. в: AIP Conference Proceedings. 2017 ; Том 1909. стр. 020196-1-020196-4.

BibTeX

@article{ab74febcb1194e48b574228fcc05fbfa,
title = "Surface self-organization in multilayer film coatings",
abstract = "It is a recognized fact that during film deposition and subsequent thermal processing the film surface evolves into an undulating profile. Surface roughness affects many important aspects in the engineering application of thin film materials such as wetting, heat transfer, mechanical, electromagnetic and optical properties. To accurately control the morphological surface modifications at the micro- and nanoscale and improve manufacturing techniques, we design a mathematical model of the surface self-organization process in multilayer film materials. In this paper, we consider a solid film coating with an arbitrary number of layers under plane strain conditions. The film surface has a small initial perturbation described by a periodic function. It is assumed that the evolution of the surface relief is governed by surface and volume diffusion. Based on Gibbs thermodynamics and linear theory of elasticity, we present a procedure for constructing a governing equation that gives the amplitude change of the surface perturbation with time. A parametric study of the evolution equation leads to the definition of a critical undulation wavelength that stabilizes the surface. As a numerical result, the influence of geometrical and physical parameters on the morphological stability of an isotropic two-layered film coating is analyzed.",
author = "Shuvalov, {Gleb M.} and Kostyrko, {Sergey A.}",
year = "2017",
month = dec,
day = "1",
doi = "10.1063/1.5013877",
language = "English",
volume = "1909",
pages = "020196--1--020196--4",
journal = "AIP Conference Proceedings",
issn = "0094-243X",
publisher = "American Institute of Physics",
note = "International Conference on Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures 2017, AMHS 2017 ; Conference date: 09-10-2017 Through 13-10-2017",

}

RIS

TY - JOUR

T1 - Surface self-organization in multilayer film coatings

AU - Shuvalov, Gleb M.

AU - Kostyrko, Sergey A.

PY - 2017/12/1

Y1 - 2017/12/1

N2 - It is a recognized fact that during film deposition and subsequent thermal processing the film surface evolves into an undulating profile. Surface roughness affects many important aspects in the engineering application of thin film materials such as wetting, heat transfer, mechanical, electromagnetic and optical properties. To accurately control the morphological surface modifications at the micro- and nanoscale and improve manufacturing techniques, we design a mathematical model of the surface self-organization process in multilayer film materials. In this paper, we consider a solid film coating with an arbitrary number of layers under plane strain conditions. The film surface has a small initial perturbation described by a periodic function. It is assumed that the evolution of the surface relief is governed by surface and volume diffusion. Based on Gibbs thermodynamics and linear theory of elasticity, we present a procedure for constructing a governing equation that gives the amplitude change of the surface perturbation with time. A parametric study of the evolution equation leads to the definition of a critical undulation wavelength that stabilizes the surface. As a numerical result, the influence of geometrical and physical parameters on the morphological stability of an isotropic two-layered film coating is analyzed.

AB - It is a recognized fact that during film deposition and subsequent thermal processing the film surface evolves into an undulating profile. Surface roughness affects many important aspects in the engineering application of thin film materials such as wetting, heat transfer, mechanical, electromagnetic and optical properties. To accurately control the morphological surface modifications at the micro- and nanoscale and improve manufacturing techniques, we design a mathematical model of the surface self-organization process in multilayer film materials. In this paper, we consider a solid film coating with an arbitrary number of layers under plane strain conditions. The film surface has a small initial perturbation described by a periodic function. It is assumed that the evolution of the surface relief is governed by surface and volume diffusion. Based on Gibbs thermodynamics and linear theory of elasticity, we present a procedure for constructing a governing equation that gives the amplitude change of the surface perturbation with time. A parametric study of the evolution equation leads to the definition of a critical undulation wavelength that stabilizes the surface. As a numerical result, the influence of geometrical and physical parameters on the morphological stability of an isotropic two-layered film coating is analyzed.

UR - http://www.scopus.com/inward/record.url?scp=85038584226&partnerID=8YFLogxK

U2 - 10.1063/1.5013877

DO - 10.1063/1.5013877

M3 - Article

AN - SCOPUS:85038584226

VL - 1909

SP - 020196-1-020196-4

JO - AIP Conference Proceedings

JF - AIP Conference Proceedings

SN - 0094-243X

T2 - International Conference on Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures 2017, AMHS 2017

Y2 - 9 October 2017 through 13 October 2017

ER -

ID: 34788469