Standard
Spectroscopic Investigations of the Stability of Porous Silicon Structure Obtained by Etching Si(100) in Aqueous Ammonium Fluoride Solution. / Filatova, E.O.; Lysenkov, K.M.; Sokolov, A.A.; Ovchinnikov, A.A.; Marchenko, D.E.; Kashkarov, V.M.; Nazarikov, I.V.
в:
Technical Physics Letters, Том 36, № 2, 2010, стр. 119-121.
Результаты исследований: Научные публикации в периодических изданиях › статья
Harvard
Filatova, EO, Lysenkov, KM, Sokolov, AA, Ovchinnikov, AA, Marchenko, DE, Kashkarov, VM & Nazarikov, IV 2010, '
Spectroscopic Investigations of the Stability of Porous Silicon Structure Obtained by Etching Si(100) in Aqueous Ammonium Fluoride Solution',
Technical Physics Letters, Том. 36, № 2, стр. 119-121.
https://doi.org/DOI: 10.1134/S1063785010020082
APA
Filatova, E. O., Lysenkov, K. M., Sokolov, A. A., Ovchinnikov, A. A., Marchenko, D. E., Kashkarov, V. M., & Nazarikov, I. V. (2010).
Spectroscopic Investigations of the Stability of Porous Silicon Structure Obtained by Etching Si(100) in Aqueous Ammonium Fluoride Solution.
Technical Physics Letters,
36(2), 119-121.
https://doi.org/DOI: 10.1134/S1063785010020082
Vancouver
Author
BibTeX
@article{b8c8251a81704d4f8c5ca7f3d9f768e6,
title = "Spectroscopic Investigations of the Stability of Porous Silicon Structure Obtained by Etching Si(100) in Aqueous Ammonium Fluoride Solution",
author = "E.O. Filatova and K.M. Lysenkov and A.A. Sokolov and A.A. Ovchinnikov and D.E. Marchenko and V.M. Kashkarov and I.V. Nazarikov",
year = "2010",
doi = "DOI: 10.1134/S1063785010020082",
language = "English",
volume = "36",
pages = "119--121",
journal = "Technical Physics Letters",
issn = "1063-7850",
publisher = "МАИК {"}Наука/Интерпериодика{"}",
number = "2",
}
RIS
TY - JOUR
T1 - Spectroscopic Investigations of the Stability of Porous Silicon Structure Obtained by Etching Si(100) in Aqueous Ammonium Fluoride Solution
AU - Filatova, E.O.
AU - Lysenkov, K.M.
AU - Sokolov, A.A.
AU - Ovchinnikov, A.A.
AU - Marchenko, D.E.
AU - Kashkarov, V.M.
AU - Nazarikov, I.V.
PY - 2010
Y1 - 2010
U2 - DOI: 10.1134/S1063785010020082
DO - DOI: 10.1134/S1063785010020082
M3 - Article
VL - 36
SP - 119
EP - 121
JO - Technical Physics Letters
JF - Technical Physics Letters
SN - 1063-7850
IS - 2
ER -