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Simulation of structure and parameters of field emission cathodes. / Egorov, Nikolay; Sheshin, Evgeny.

Springer Series in Advanced Microelectronics. Том 60 Springer Nature, 2017. стр. 171-228 (Springer Series in Advanced Microelectronics; Том 60).

Результаты исследований: Публикации в книгах, отчётах, сборниках, трудах конференций › глава/раздел › научная › Рецензирование

Harvard

Egorov, N & Sheshin, E 2017, Simulation of structure and parameters of field emission cathodes. в Springer Series in Advanced Microelectronics. Том. 60, Springer Series in Advanced Microelectronics, Том. 60, Springer Nature, стр. 171-228. https://doi.org/10.1007/978-3-319-56561-3_4

APA

Egorov, N., & Sheshin, E. (2017). Simulation of structure and parameters of field emission cathodes. в Springer Series in Advanced Microelectronics (Том 60, стр. 171-228). (Springer Series in Advanced Microelectronics; Том 60). Springer Nature. https://doi.org/10.1007/978-3-319-56561-3_4

Vancouver

Egorov N, Sheshin E. Simulation of structure and parameters of field emission cathodes. в Springer Series in Advanced Microelectronics. Том 60. Springer Nature. 2017. стр. 171-228. (Springer Series in Advanced Microelectronics). https://doi.org/10.1007/978-3-319-56561-3_4

Author

Egorov, Nikolay ; Sheshin, Evgeny. / Simulation of structure and parameters of field emission cathodes. Springer Series in Advanced Microelectronics. Том 60 Springer Nature, 2017. стр. 171-228 (Springer Series in Advanced Microelectronics).

BibTeX

@inbook{265084b23f3e445bb2c8c4a8c0807eb9,
title = "Simulation of structure and parameters of field emission cathodes",
abstract = "In this chapter, simulation of a surface potential barrier is presented and method of determining the barrier permeability based on experimental data is proposed. It also presents simulation of current–voltage characteristics, surface structure and distribution of the work function over the surface of metal field-emission cathode for a model configuration of its vertices. Theoretical studies of the physical processes affecting the field-emission current density limits are discussed towards the end of the chapter.",
author = "Nikolay Egorov and Evgeny Sheshin",
year = "2017",
doi = "10.1007/978-3-319-56561-3_4",
language = "English",
volume = "60",
series = "Springer Series in Advanced Microelectronics",
publisher = "Springer Nature",
pages = "171--228",
booktitle = "Springer Series in Advanced Microelectronics",
address = "Germany",

}

RIS

TY - CHAP

T1 - Simulation of structure and parameters of field emission cathodes

AU - Egorov, Nikolay

AU - Sheshin, Evgeny

PY - 2017

Y1 - 2017

N2 - In this chapter, simulation of a surface potential barrier is presented and method of determining the barrier permeability based on experimental data is proposed. It also presents simulation of current–voltage characteristics, surface structure and distribution of the work function over the surface of metal field-emission cathode for a model configuration of its vertices. Theoretical studies of the physical processes affecting the field-emission current density limits are discussed towards the end of the chapter.

AB - In this chapter, simulation of a surface potential barrier is presented and method of determining the barrier permeability based on experimental data is proposed. It also presents simulation of current–voltage characteristics, surface structure and distribution of the work function over the surface of metal field-emission cathode for a model configuration of its vertices. Theoretical studies of the physical processes affecting the field-emission current density limits are discussed towards the end of the chapter.

UR - http://www.scopus.com/inward/record.url?scp=85020192506&partnerID=8YFLogxK

U2 - 10.1007/978-3-319-56561-3_4

DO - 10.1007/978-3-319-56561-3_4

M3 - Chapter

AN - SCOPUS:85020192506

VL - 60

T3 - Springer Series in Advanced Microelectronics

SP - 171

EP - 228

BT - Springer Series in Advanced Microelectronics

PB - Springer Nature

ER -

ID: 9448207