Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование
Role of the impurity band during the insulator-metal transition as the composition of highly doped and compensated TiCo1-xNixSb semiconductor alloy is varied. Donor impurities. / Romaka, V. A.; Shelyapina, M. G.; Stadnyk, Yu V.; Fruchart, D.; Romaka, L. P.; Chekurin, V. F.
в: Semiconductors, Том 40, № 7, 07.2006, стр. 776-780.Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование
}
TY - JOUR
T1 - Role of the impurity band during the insulator-metal transition as the composition of highly doped and compensated TiCo1-xNixSb semiconductor alloy is varied. Donor impurities
AU - Romaka, V. A.
AU - Shelyapina, M. G.
AU - Stadnyk, Yu V.
AU - Fruchart, D.
AU - Romaka, L. P.
AU - Chekurin, V. F.
PY - 2006/7
Y1 - 2006/7
N2 - The role of the impurity donor band in the conductivity of the heavily doped and compensated intermetallic TiCoSb semiconductor is determined. The electronic structure of the TiCo1-x NixSb semiconductor alloy is calculated. A model of impurity band transformation in the TiCoSb semiconductor due to donor impurity doping is suggested. The transition from activated to metallic conductivity when varying the TiCo1-x Ni xSb alloy composition is detected, which we identify with the Anderson transition.
AB - The role of the impurity donor band in the conductivity of the heavily doped and compensated intermetallic TiCoSb semiconductor is determined. The electronic structure of the TiCo1-x NixSb semiconductor alloy is calculated. A model of impurity band transformation in the TiCoSb semiconductor due to donor impurity doping is suggested. The transition from activated to metallic conductivity when varying the TiCo1-x Ni xSb alloy composition is detected, which we identify with the Anderson transition.
UR - http://www.scopus.com/inward/record.url?scp=33745522125&partnerID=8YFLogxK
U2 - 10.1134/S1063782606070074
DO - 10.1134/S1063782606070074
M3 - Article
AN - SCOPUS:33745522125
VL - 40
SP - 776
EP - 780
JO - Semiconductors
JF - Semiconductors
SN - 1063-7826
IS - 7
ER -
ID: 16796823