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Processing and identification of field-emission images of metallic surfaces. / Egorov, N. V.; Karpov, A. G.; Shen, Che Chou.

в: Journal of Surface Investigation, Том 3, № 1, 08.2009, стр. 165-171.

Результаты исследований: Научные публикации в периодических изданияхстатьяРецензирование

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Egorov, N. V. ; Karpov, A. G. ; Shen, Che Chou. / Processing and identification of field-emission images of metallic surfaces. в: Journal of Surface Investigation. 2009 ; Том 3, № 1. стр. 165-171.

BibTeX

@article{cc6374739fff42abb45955ba3185f882,
title = "Processing and identification of field-emission images of metallic surfaces",
abstract = "Techniques and algorithms for recording and processing field-emission images have been proposed. An original method of identifying individual crystal faces and directions in the surface structure based on fieldemission images and information on the emitter lattice type is described. The results may be used for detailed investigation of field electron emission under various impacts on the metallic surface.",
author = "Egorov, {N. V.} and Karpov, {A. G.} and Shen, {Che Chou}",
year = "2009",
month = aug,
doi = "10.1134/S1027451009010273",
language = "English",
volume = "3",
pages = "165--171",
journal = "ПОВЕРХНОСТЬ. РЕНТГЕНОВСКИЕ, СИНХРОТРОННЫЕ И НЕЙТРОННЫЕ ИССЛЕДОВАНИЯ",
issn = "1027-4510",
publisher = "МАИК {"}Наука/Интерпериодика{"}",
number = "1",

}

RIS

TY - JOUR

T1 - Processing and identification of field-emission images of metallic surfaces

AU - Egorov, N. V.

AU - Karpov, A. G.

AU - Shen, Che Chou

PY - 2009/8

Y1 - 2009/8

N2 - Techniques and algorithms for recording and processing field-emission images have been proposed. An original method of identifying individual crystal faces and directions in the surface structure based on fieldemission images and information on the emitter lattice type is described. The results may be used for detailed investigation of field electron emission under various impacts on the metallic surface.

AB - Techniques and algorithms for recording and processing field-emission images have been proposed. An original method of identifying individual crystal faces and directions in the surface structure based on fieldemission images and information on the emitter lattice type is described. The results may be used for detailed investigation of field electron emission under various impacts on the metallic surface.

UR - http://www.scopus.com/inward/record.url?scp=70350306573&partnerID=8YFLogxK

U2 - 10.1134/S1027451009010273

DO - 10.1134/S1027451009010273

M3 - Article

AN - SCOPUS:70350306573

VL - 3

SP - 165

EP - 171

JO - ПОВЕРХНОСТЬ. РЕНТГЕНОВСКИЕ, СИНХРОТРОННЫЕ И НЕЙТРОННЫЕ ИССЛЕДОВАНИЯ

JF - ПОВЕРХНОСТЬ. РЕНТГЕНОВСКИЕ, СИНХРОТРОННЫЕ И НЕЙТРОННЫЕ ИССЛЕДОВАНИЯ

SN - 1027-4510

IS - 1

ER -

ID: 9448860