Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование
Polarized p–n junction Si photodetector enabled by direct laser-induced periodic surface structuring. / Borodaenko, Yulia; Cherepakhin, Artem; Gurbatov, Stanislav O.; Modin, Evgeny; Shevlyagin, Aleksandr V.; Kuchmizhak, Aleksandr A.
в: Surfaces and Interfaces, Том 56, 105568, 01.01.2025.Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование
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TY - JOUR
T1 - Polarized p–n junction Si photodetector enabled by direct laser-induced periodic surface structuring
AU - Borodaenko, Yulia
AU - Cherepakhin, Artem
AU - Gurbatov, Stanislav O.
AU - Modin, Evgeny
AU - Shevlyagin, Aleksandr V.
AU - Kuchmizhak, Aleksandr A.
PY - 2025/1/1
Y1 - 2025/1/1
N2 - Monocrystalline silicon (Si or c-Si) is of paramount importance for modern optoelectronics, yet its centrosymmetric crystal lattice restricts any inherent optical anisotropy. This fundamental limitation precludes construction of polarization-sensitive Si-based photodetectors (PD) relevant for bioimaging, information encryption and ellipsometry. In this work, we used laser-induced periodic surface structuring (LIPSS) to directly imprint optically anisotropic nanogratings with a periodicity around 270 nm over the active area of a vertical p–n junction Si PD. Sensitivity to polarization of the incident radiation was observed within 700–1100 nm spectral range with a photoresponse modulation up to 80% for the cross-polarized light under zero bias conditions. Defect-mediated absorption within laser-patterned layer was found to expand operation range of the PD rendering it with ability to detect photons with sub-band gap energies (up to 1400 nm), while causing no crucial degradation of dynamic characteristics and photoresponse of the self-powered device within common operation window. Under a small reverse bias of 1 V, the LIPSS-patterned PD provides cross-polarized photoresponse modulation up to 430% surpassing 100% external quantum efficiency benchmark under optimal excitation. Importantly, such competitive device performance was achieved through facile upscalable procedure without hyperdoping requiring expensive gas chambers and toxic chemicals.
AB - Monocrystalline silicon (Si or c-Si) is of paramount importance for modern optoelectronics, yet its centrosymmetric crystal lattice restricts any inherent optical anisotropy. This fundamental limitation precludes construction of polarization-sensitive Si-based photodetectors (PD) relevant for bioimaging, information encryption and ellipsometry. In this work, we used laser-induced periodic surface structuring (LIPSS) to directly imprint optically anisotropic nanogratings with a periodicity around 270 nm over the active area of a vertical p–n junction Si PD. Sensitivity to polarization of the incident radiation was observed within 700–1100 nm spectral range with a photoresponse modulation up to 80% for the cross-polarized light under zero bias conditions. Defect-mediated absorption within laser-patterned layer was found to expand operation range of the PD rendering it with ability to detect photons with sub-band gap energies (up to 1400 nm), while causing no crucial degradation of dynamic characteristics and photoresponse of the self-powered device within common operation window. Under a small reverse bias of 1 V, the LIPSS-patterned PD provides cross-polarized photoresponse modulation up to 430% surpassing 100% external quantum efficiency benchmark under optimal excitation. Importantly, such competitive device performance was achieved through facile upscalable procedure without hyperdoping requiring expensive gas chambers and toxic chemicals.
KW - Femtosecond lasers
KW - Laser-induced periodic surface structures
KW - Polarization-sensitive photoresponse
KW - Silicon
KW - p–n junction photodetector
UR - https://www.mendeley.com/catalogue/92e027a3-842d-3c5e-b025-5b6d04d65df0/
U2 - 10.1016/j.surfin.2024.105568
DO - 10.1016/j.surfin.2024.105568
M3 - Article
VL - 56
JO - Surfaces and Interfaces
JF - Surfaces and Interfaces
SN - 2468-0230
M1 - 105568
ER -
ID: 132510201