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Polarized neutron reflectometry from the interface of the heterostructures SiO2(Co)/Si and SiO2(Co)/GaAs. / Dyadkina, Ekaterina A.; Grigoryeva, Natalia A.; Vorobiev, Alexey A.; Grigoriev, Sergey V.; Lutsev, Leonid V.; Zhernenkov, Kirill; Wolff, Maximilian; Lott, Dieter; Stognij, Alexander I.; Novitskii, Nicolay N.; Toperverg, Boris P.

в: Physica B: Condensed Matter, Том 404, № 17, 01.09.2009, стр. 2547-2549.

Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование

Harvard

Dyadkina, EA, Grigoryeva, NA, Vorobiev, AA, Grigoriev, SV, Lutsev, LV, Zhernenkov, K, Wolff, M, Lott, D, Stognij, AI, Novitskii, NN & Toperverg, BP 2009, 'Polarized neutron reflectometry from the interface of the heterostructures SiO2(Co)/Si and SiO2(Co)/GaAs', Physica B: Condensed Matter, Том. 404, № 17, стр. 2547-2549. https://doi.org/10.1016/j.physb.2009.06.019

APA

Dyadkina, E. A., Grigoryeva, N. A., Vorobiev, A. A., Grigoriev, S. V., Lutsev, L. V., Zhernenkov, K., Wolff, M., Lott, D., Stognij, A. I., Novitskii, N. N., & Toperverg, B. P. (2009). Polarized neutron reflectometry from the interface of the heterostructures SiO2(Co)/Si and SiO2(Co)/GaAs. Physica B: Condensed Matter, 404(17), 2547-2549. https://doi.org/10.1016/j.physb.2009.06.019

Vancouver

Dyadkina EA, Grigoryeva NA, Vorobiev AA, Grigoriev SV, Lutsev LV, Zhernenkov K и пр. Polarized neutron reflectometry from the interface of the heterostructures SiO2(Co)/Si and SiO2(Co)/GaAs. Physica B: Condensed Matter. 2009 Сент. 1;404(17):2547-2549. https://doi.org/10.1016/j.physb.2009.06.019

Author

Dyadkina, Ekaterina A. ; Grigoryeva, Natalia A. ; Vorobiev, Alexey A. ; Grigoriev, Sergey V. ; Lutsev, Leonid V. ; Zhernenkov, Kirill ; Wolff, Maximilian ; Lott, Dieter ; Stognij, Alexander I. ; Novitskii, Nicolay N. ; Toperverg, Boris P. / Polarized neutron reflectometry from the interface of the heterostructures SiO2(Co)/Si and SiO2(Co)/GaAs. в: Physica B: Condensed Matter. 2009 ; Том 404, № 17. стр. 2547-2549.

BibTeX

@article{e5ce209514564a08adaa521956fc6e24,
title = "Polarized neutron reflectometry from the interface of the heterostructures SiO2(Co)/Si and SiO2(Co)/GaAs",
abstract = "Polarized neutron reflectometry is used to investigate SiO2(Co) granular films (70 at% of Co nanoparticles in SiO2 matrix) deposited on Si and GaAs substrates. The aim of the study is to compare magnetization depth profiles in two systems: in SiO2(Co)/GaAs heterostructure which shows at room temperature giant injection magnetoresistance (IMR) with the system SiO2(Co)/Si which reveals almost no IMR effect. We found that at room temperature and at the same value of external magnetic field mean magnetization in the SiO2(Co)/GaAs sample is much higher than in the case of SiO2(Co)/Si. We also demonstrate that magnetic scattering length density, and hence, magnetization profile strongly depends on the substrate. We show that SiO2(Co)/Si heterostructure is ferromagnetically ordered within the temperature range between 120 and 460 K what could explain a weak IMR.",
keywords = "Injection magnetoresistance, Interface, Nanoparticles, Polarized neutron reflectometry",
author = "Dyadkina, {Ekaterina A.} and Grigoryeva, {Natalia A.} and Vorobiev, {Alexey A.} and Grigoriev, {Sergey V.} and Lutsev, {Leonid V.} and Kirill Zhernenkov and Maximilian Wolff and Dieter Lott and Stognij, {Alexander I.} and Novitskii, {Nicolay N.} and Toperverg, {Boris P.}",
year = "2009",
month = sep,
day = "1",
doi = "10.1016/j.physb.2009.06.019",
language = "English",
volume = "404",
pages = "2547--2549",
journal = "Physica B: Condensed Matter",
issn = "0921-4526",
publisher = "Elsevier",
number = "17",

}

RIS

TY - JOUR

T1 - Polarized neutron reflectometry from the interface of the heterostructures SiO2(Co)/Si and SiO2(Co)/GaAs

AU - Dyadkina, Ekaterina A.

AU - Grigoryeva, Natalia A.

AU - Vorobiev, Alexey A.

AU - Grigoriev, Sergey V.

AU - Lutsev, Leonid V.

AU - Zhernenkov, Kirill

AU - Wolff, Maximilian

AU - Lott, Dieter

AU - Stognij, Alexander I.

AU - Novitskii, Nicolay N.

AU - Toperverg, Boris P.

PY - 2009/9/1

Y1 - 2009/9/1

N2 - Polarized neutron reflectometry is used to investigate SiO2(Co) granular films (70 at% of Co nanoparticles in SiO2 matrix) deposited on Si and GaAs substrates. The aim of the study is to compare magnetization depth profiles in two systems: in SiO2(Co)/GaAs heterostructure which shows at room temperature giant injection magnetoresistance (IMR) with the system SiO2(Co)/Si which reveals almost no IMR effect. We found that at room temperature and at the same value of external magnetic field mean magnetization in the SiO2(Co)/GaAs sample is much higher than in the case of SiO2(Co)/Si. We also demonstrate that magnetic scattering length density, and hence, magnetization profile strongly depends on the substrate. We show that SiO2(Co)/Si heterostructure is ferromagnetically ordered within the temperature range between 120 and 460 K what could explain a weak IMR.

AB - Polarized neutron reflectometry is used to investigate SiO2(Co) granular films (70 at% of Co nanoparticles in SiO2 matrix) deposited on Si and GaAs substrates. The aim of the study is to compare magnetization depth profiles in two systems: in SiO2(Co)/GaAs heterostructure which shows at room temperature giant injection magnetoresistance (IMR) with the system SiO2(Co)/Si which reveals almost no IMR effect. We found that at room temperature and at the same value of external magnetic field mean magnetization in the SiO2(Co)/GaAs sample is much higher than in the case of SiO2(Co)/Si. We also demonstrate that magnetic scattering length density, and hence, magnetization profile strongly depends on the substrate. We show that SiO2(Co)/Si heterostructure is ferromagnetically ordered within the temperature range between 120 and 460 K what could explain a weak IMR.

KW - Injection magnetoresistance

KW - Interface

KW - Nanoparticles

KW - Polarized neutron reflectometry

UR - http://www.scopus.com/inward/record.url?scp=68649125248&partnerID=8YFLogxK

U2 - 10.1016/j.physb.2009.06.019

DO - 10.1016/j.physb.2009.06.019

M3 - Article

AN - SCOPUS:68649125248

VL - 404

SP - 2547

EP - 2549

JO - Physica B: Condensed Matter

JF - Physica B: Condensed Matter

SN - 0921-4526

IS - 17

ER -

ID: 28231143