Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование
Photoelectrochemical behavior of Nb-doped TiO2 electrodes. / Emeline, Alexei V.; Furubayashi, Yutaka; Zhang, Xintong; Jin, Ming; Murakami, Taketoshi; Fujishima, Akira.
в: Journal of Physical Chemistry B, Том 109, № 51, 29.12.2005, стр. 24441-24444.Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование
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TY - JOUR
T1 - Photoelectrochemical behavior of Nb-doped TiO2 electrodes
AU - Emeline, Alexei V.
AU - Furubayashi, Yutaka
AU - Zhang, Xintong
AU - Jin, Ming
AU - Murakami, Taketoshi
AU - Fujishima, Akira
PY - 2005/12/29
Y1 - 2005/12/29
N2 - The photoelectrochemical behavior of degenerate Nb-doped TiO2 (Ti1-xNbxO2: x = 0, 0.01, 0.03, 0.06, 0.1) electrodes prepared by pulsed laser deposition on LaAlO3 (LAO) and SrTiO3 (STO) was examined, revealing that an increase in Nb concentration causes a significant decay of titania photoactivity. One reason for such behavior may be a Burstein-Moss effect, which leads to a blue shift of the spectral limit of photoactivity. Another reason typical for metal-doped photocatalysts is the increase of the efficiency of charge carrier recombination.
AB - The photoelectrochemical behavior of degenerate Nb-doped TiO2 (Ti1-xNbxO2: x = 0, 0.01, 0.03, 0.06, 0.1) electrodes prepared by pulsed laser deposition on LaAlO3 (LAO) and SrTiO3 (STO) was examined, revealing that an increase in Nb concentration causes a significant decay of titania photoactivity. One reason for such behavior may be a Burstein-Moss effect, which leads to a blue shift of the spectral limit of photoactivity. Another reason typical for metal-doped photocatalysts is the increase of the efficiency of charge carrier recombination.
UR - http://www.scopus.com/inward/record.url?scp=30344455003&partnerID=8YFLogxK
U2 - 10.1021/jp055090e
DO - 10.1021/jp055090e
M3 - Article
AN - SCOPUS:30344455003
VL - 109
SP - 24441
EP - 24444
JO - Journal of Physical Chemistry B
JF - Journal of Physical Chemistry B
SN - 1520-6106
IS - 51
ER -
ID: 35141969