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Optical Investigation of the Vertical Diffusion of Manganese in Planar Structures Based on CdTe and Cd1-xMgxTe with Ultrathin MnTe Layers. / Agekyan, V.F.; Grunina, N.A.; Serov, A.Y.; Filosofov, N.G.; Karczewski, G.

в: Physics of the Solid State, Том 56, № 11, 2014, стр. 2149-2154.

Результаты исследований: Научные публикации в периодических изданиях › статья

Harvard

Agekyan, VF, Grunina, NA, Serov, AY, Filosofov, NG & Karczewski, G 2014, 'Optical Investigation of the Vertical Diffusion of Manganese in Planar Structures Based on CdTe and Cd1-xMgxTe with Ultrathin MnTe Layers', Physics of the Solid State, Том. 56, № 11, стр. 2149-2154. https://doi.org/10.1134/S106378341411002X

APA

Agekyan, V. F., Grunina, N. A., Serov, A. Y., Filosofov, N. G., & Karczewski, G. (2014). Optical Investigation of the Vertical Diffusion of Manganese in Planar Structures Based on CdTe and Cd1-xMgxTe with Ultrathin MnTe Layers. Physics of the Solid State, 56(11), 2149-2154. https://doi.org/10.1134/S106378341411002X

Vancouver

Agekyan VF, Grunina NA, Serov AY, Filosofov NG, Karczewski G. Optical Investigation of the Vertical Diffusion of Manganese in Planar Structures Based on CdTe and Cd1-xMgxTe with Ultrathin MnTe Layers. Physics of the Solid State. 2014;56(11):2149-2154. https://doi.org/10.1134/S106378341411002X

Author

Agekyan, V.F. ; Grunina, N.A. ; Serov, A.Y. ; Filosofov, N.G. ; Karczewski, G. / Optical Investigation of the Vertical Diffusion of Manganese in Planar Structures Based on CdTe and Cd1-xMgxTe with Ultrathin MnTe Layers. в: Physics of the Solid State. 2014 ; Том 56, № 11. стр. 2149-2154.

BibTeX

@article{93ba52a60cb640adacf616de829d4301,
title = "Optical Investigation of the Vertical Diffusion of Manganese in Planar Structures Based on CdTe and Cd1-xMgxTe with Ultrathin MnTe Layers",
abstract = "The emission spectra of planar structures based on CdTe and Cd1-xMgxTe containing periodically builtin MnTe layers with a nominal thickness of one monolayer have been investigated. The luminescence spectra and luminescence excitation spectra of manganese ions and excitons, as well as the dependences of the spectra on the temperature and magnetic field strength, are used to determine the actual distribution of manganese ions. The full width at halfmaximum of the profile describing the change in the concentration of manganese in the growth direction of the structures is estimated to be 7–8 monolayers.",
author = "V.F. Agekyan and N.A. Grunina and A.Y. Serov and N.G. Filosofov and G. Karczewski",
year = "2014",
doi = "10.1134/S106378341411002X",
language = "English",
volume = "56",
pages = "2149--2154",
journal = "Physics of the Solid State",
issn = "1063-7834",
publisher = "МАИК {"}Наука/Интерпериодика{"}",
number = "11",

}

RIS

TY - JOUR

T1 - Optical Investigation of the Vertical Diffusion of Manganese in Planar Structures Based on CdTe and Cd1-xMgxTe with Ultrathin MnTe Layers

AU - Agekyan, V.F.

AU - Grunina, N.A.

AU - Serov, A.Y.

AU - Filosofov, N.G.

AU - Karczewski, G.

PY - 2014

Y1 - 2014

N2 - The emission spectra of planar structures based on CdTe and Cd1-xMgxTe containing periodically builtin MnTe layers with a nominal thickness of one monolayer have been investigated. The luminescence spectra and luminescence excitation spectra of manganese ions and excitons, as well as the dependences of the spectra on the temperature and magnetic field strength, are used to determine the actual distribution of manganese ions. The full width at halfmaximum of the profile describing the change in the concentration of manganese in the growth direction of the structures is estimated to be 7–8 monolayers.

AB - The emission spectra of planar structures based on CdTe and Cd1-xMgxTe containing periodically builtin MnTe layers with a nominal thickness of one monolayer have been investigated. The luminescence spectra and luminescence excitation spectra of manganese ions and excitons, as well as the dependences of the spectra on the temperature and magnetic field strength, are used to determine the actual distribution of manganese ions. The full width at halfmaximum of the profile describing the change in the concentration of manganese in the growth direction of the structures is estimated to be 7–8 monolayers.

U2 - 10.1134/S106378341411002X

DO - 10.1134/S106378341411002X

M3 - Article

VL - 56

SP - 2149

EP - 2154

JO - Physics of the Solid State

JF - Physics of the Solid State

SN - 1063-7834

IS - 11

ER -

ID: 7030085