Standard

On binarization of images at the pavement defects recognition. / Shumilov, Boris; Gerasimova, Yuliya; Makarov, Anton.

Proceedings of the 2018 IEEE International Conference on Electrical Engineering and Photonics, EExPolytech 2018. ред. / E. Velichko. Institute of Electrical and Electronics Engineers Inc., 2018. стр. 107-110 8564396.

Результаты исследований: Публикации в книгах, отчётах, сборниках, трудах конференций › статья в сборнике материалов конференции › Рецензирование

Harvard

Shumilov, B, Gerasimova, Y & Makarov, A 2018, On binarization of images at the pavement defects recognition. в E Velichko (ред.), Proceedings of the 2018 IEEE International Conference on Electrical Engineering and Photonics, EExPolytech 2018., 8564396, Institute of Electrical and Electronics Engineers Inc., стр. 107-110, 2018 IEEE International Conference on Electrical Engineering and Photonics, EExPolytech 2018, St. Petersburg, Российская Федерация, 22/10/18. https://doi.org/10.1109/EExPolytech.2018.8564396

APA

Shumilov, B., Gerasimova, Y., & Makarov, A. (2018). On binarization of images at the pavement defects recognition. в E. Velichko (Ред.), Proceedings of the 2018 IEEE International Conference on Electrical Engineering and Photonics, EExPolytech 2018 (стр. 107-110). [8564396] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/EExPolytech.2018.8564396

Vancouver

Shumilov B, Gerasimova Y, Makarov A. On binarization of images at the pavement defects recognition. в Velichko E, Редактор, Proceedings of the 2018 IEEE International Conference on Electrical Engineering and Photonics, EExPolytech 2018. Institute of Electrical and Electronics Engineers Inc. 2018. стр. 107-110. 8564396 https://doi.org/10.1109/EExPolytech.2018.8564396

Author

Shumilov, Boris ; Gerasimova, Yuliya ; Makarov, Anton. / On binarization of images at the pavement defects recognition. Proceedings of the 2018 IEEE International Conference on Electrical Engineering and Photonics, EExPolytech 2018. Редактор / E. Velichko. Institute of Electrical and Electronics Engineers Inc., 2018. стр. 107-110

BibTeX

@inproceedings{ff15cca617454b389fdfc463f86a1de6,
title = "On binarization of images at the pavement defects recognition",
abstract = "Allocation of object borders is the one of the most important tasks at pavement damages recognition. They contain exhaustive information on it's form, for the subsequent analysis. The method of binarization of the initial image copes with this task. But this process is characterized by existence of a large number of distortions: washing out, gaps and loss of objects integrity, emergence of noise in homogeneous areas. Demand of the mistakes elimination has led to emergence of a large count of binarization methods. The choice of a binarization method and search of the optimum (for some set of parameters) algorithm influences the algorithms applied further to the image analysis. In this article we consider the most popular and modern binarization methods concerning problems of recognition of pavement damages.",
keywords = "binarization, edge detection, highways, pavement defects recognition",
author = "Boris Shumilov and Yuliya Gerasimova and Anton Makarov",
year = "2018",
month = dec,
day = "5",
doi = "10.1109/EExPolytech.2018.8564396",
language = "English",
pages = "107--110",
editor = "E. Velichko",
booktitle = "Proceedings of the 2018 IEEE International Conference on Electrical Engineering and Photonics, EExPolytech 2018",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
address = "United States",
note = "2018 IEEE International Conference on Electrical Engineering and Photonics, EExPolytech 2018 ; Conference date: 22-10-2018 Through 23-10-2018",

}

RIS

TY - GEN

T1 - On binarization of images at the pavement defects recognition

AU - Shumilov, Boris

AU - Gerasimova, Yuliya

AU - Makarov, Anton

PY - 2018/12/5

Y1 - 2018/12/5

N2 - Allocation of object borders is the one of the most important tasks at pavement damages recognition. They contain exhaustive information on it's form, for the subsequent analysis. The method of binarization of the initial image copes with this task. But this process is characterized by existence of a large number of distortions: washing out, gaps and loss of objects integrity, emergence of noise in homogeneous areas. Demand of the mistakes elimination has led to emergence of a large count of binarization methods. The choice of a binarization method and search of the optimum (for some set of parameters) algorithm influences the algorithms applied further to the image analysis. In this article we consider the most popular and modern binarization methods concerning problems of recognition of pavement damages.

AB - Allocation of object borders is the one of the most important tasks at pavement damages recognition. They contain exhaustive information on it's form, for the subsequent analysis. The method of binarization of the initial image copes with this task. But this process is characterized by existence of a large number of distortions: washing out, gaps and loss of objects integrity, emergence of noise in homogeneous areas. Demand of the mistakes elimination has led to emergence of a large count of binarization methods. The choice of a binarization method and search of the optimum (for some set of parameters) algorithm influences the algorithms applied further to the image analysis. In this article we consider the most popular and modern binarization methods concerning problems of recognition of pavement damages.

KW - binarization

KW - edge detection

KW - highways

KW - pavement defects recognition

UR - http://www.scopus.com/inward/record.url?scp=85060249679&partnerID=8YFLogxK

U2 - 10.1109/EExPolytech.2018.8564396

DO - 10.1109/EExPolytech.2018.8564396

M3 - Conference contribution

AN - SCOPUS:85060249679

SP - 107

EP - 110

BT - Proceedings of the 2018 IEEE International Conference on Electrical Engineering and Photonics, EExPolytech 2018

A2 - Velichko, E.

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 2018 IEEE International Conference on Electrical Engineering and Photonics, EExPolytech 2018

Y2 - 22 October 2018 through 23 October 2018

ER -

ID: 38269798