Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование
Observation of transition metals at shunt locations in multicrystalline silicon solar cells. / Buonassisi, T.; Vyvenko, O. F.; Istratov, A. A.; Weber, E. R.; Hahn, G.; Sontag, D.; Rakotoniaina, J. P.; Breitenstein, O.; Isenberg, J.; Schindler, R.
в: Journal of Applied Physics, Том 95, № 3, 01.02.2004, стр. 1556-1561.Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование
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TY - JOUR
T1 - Observation of transition metals at shunt locations in multicrystalline silicon solar cells
AU - Buonassisi, T.
AU - Vyvenko, O. F.
AU - Istratov, A. A.
AU - Weber, E. R.
AU - Hahn, G.
AU - Sontag, D.
AU - Rakotoniaina, J. P.
AU - Breitenstein, O.
AU - Isenberg, J.
AU - Schindler, R.
PY - 2004/2/1
Y1 - 2004/2/1
N2 - An experimental procedure was demosntrated to detect transition metals at shunting locations in solar cells, involving lock-in thermography, SR-LBIC, XBIC, and μ-XRF. Thus, transition metals were found to be present in higher than average concentrations at both shunts analyzed in the study. Such results can be explained most effectively by the presence of field charges at the cores of the channels, which cause local band bending in the vicinity of the channel to occur, thus attracting minority charges to the channels.
AB - An experimental procedure was demosntrated to detect transition metals at shunting locations in solar cells, involving lock-in thermography, SR-LBIC, XBIC, and μ-XRF. Thus, transition metals were found to be present in higher than average concentrations at both shunts analyzed in the study. Such results can be explained most effectively by the presence of field charges at the cores of the channels, which cause local band bending in the vicinity of the channel to occur, thus attracting minority charges to the channels.
UR - http://www.scopus.com/inward/record.url?scp=10744232470&partnerID=8YFLogxK
U2 - 10.1063/1.1636252
DO - 10.1063/1.1636252
M3 - Article
AN - SCOPUS:10744232470
VL - 95
SP - 1556
EP - 1561
JO - Journal of Applied Physics
JF - Journal of Applied Physics
SN - 0021-8979
IS - 3
ER -
ID: 87814525