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Nonequilibrium Mechanisms of Weak Electrolyte Electrification under the Action of Constant Voltage. / Stishkov, Yu. K.; Chirkov, V. A.

в: Technical Physics, Том 61, № 7, 2016, стр. 957-964.

Результаты исследований: Научные публикации в периодических изданияхстатьяРецензирование

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@article{2aa01183a21b48b48851490a5c34608a,
title = "Nonequilibrium Mechanisms of Weak Electrolyte Electrification under the Action of Constant Voltage",
abstract = "The formation of space charge in weak electrolytes, specifically in liquid dielectrics, has been considered. An analytical solution is given to a simplified set of Nernst-Planck equations that describe the formation of nonequilibrium recombination layers in weak electrolytes. This approximate analytical solution is compared with computer simulation data for a complete set of Poisson-Nernst-Planck equations. It has been shown that the current passage in weak electrolytes can be described by a single dimensionless parameter that equals the length of a near-electrode recombination layer divided by the width of the interelectrode gap. The formation mechanism and the structure of charged nonequilibrium near-electrode layers in the nonstationary regime have been analyzed for different injection-to-conduction current ratios. It has been found that almost all charge structures encountered in weak dielectrics can be accounted for by the nonequilibrium dissociation-recombination mechanism of space charge formation.",
keywords = "LIQUIDS",
author = "Stishkov, {Yu. K.} and Chirkov, {V. A.}",
year = "2016",
doi = "10.1134/S1063784216070276",
language = "English",
volume = "61",
pages = "957--964",
journal = "Technical Physics",
issn = "1063-7842",
publisher = "Pleiades Publishing",
number = "7",

}

RIS

TY - JOUR

T1 - Nonequilibrium Mechanisms of Weak Electrolyte Electrification under the Action of Constant Voltage

AU - Stishkov, Yu. K.

AU - Chirkov, V. A.

PY - 2016

Y1 - 2016

N2 - The formation of space charge in weak electrolytes, specifically in liquid dielectrics, has been considered. An analytical solution is given to a simplified set of Nernst-Planck equations that describe the formation of nonequilibrium recombination layers in weak electrolytes. This approximate analytical solution is compared with computer simulation data for a complete set of Poisson-Nernst-Planck equations. It has been shown that the current passage in weak electrolytes can be described by a single dimensionless parameter that equals the length of a near-electrode recombination layer divided by the width of the interelectrode gap. The formation mechanism and the structure of charged nonequilibrium near-electrode layers in the nonstationary regime have been analyzed for different injection-to-conduction current ratios. It has been found that almost all charge structures encountered in weak dielectrics can be accounted for by the nonequilibrium dissociation-recombination mechanism of space charge formation.

AB - The formation of space charge in weak electrolytes, specifically in liquid dielectrics, has been considered. An analytical solution is given to a simplified set of Nernst-Planck equations that describe the formation of nonequilibrium recombination layers in weak electrolytes. This approximate analytical solution is compared with computer simulation data for a complete set of Poisson-Nernst-Planck equations. It has been shown that the current passage in weak electrolytes can be described by a single dimensionless parameter that equals the length of a near-electrode recombination layer divided by the width of the interelectrode gap. The formation mechanism and the structure of charged nonequilibrium near-electrode layers in the nonstationary regime have been analyzed for different injection-to-conduction current ratios. It has been found that almost all charge structures encountered in weak dielectrics can be accounted for by the nonequilibrium dissociation-recombination mechanism of space charge formation.

KW - LIQUIDS

U2 - 10.1134/S1063784216070276

DO - 10.1134/S1063784216070276

M3 - Article

VL - 61

SP - 957

EP - 964

JO - Technical Physics

JF - Technical Physics

SN - 1063-7842

IS - 7

ER -

ID: 7577304