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Modern approaches to investigation of thin films and monolayers : X-ray reflectivity, grazing-incidence X-ray scattering and X-ray standing waves. / Shcherbina, M. A.; Chvalun, S. N.; Ponomarenko, S. A.; Kovalchuk, M. V.

в: Russian Chemical Reviews, Том 83, № 12, 2014, стр. 1091-1119.

Результаты исследований: Научные публикации в периодических изданиях › Обзорная статья › Рецензирование

Harvard

Shcherbina, MA, Chvalun, SN, Ponomarenko, SA & Kovalchuk, MV 2014, 'Modern approaches to investigation of thin films and monolayers: X-ray reflectivity, grazing-incidence X-ray scattering and X-ray standing waves', Russian Chemical Reviews, Том. 83, № 12, стр. 1091-1119. https://doi.org/10.1070/RCR4485

APA

Shcherbina, M. A., Chvalun, S. N., Ponomarenko, S. A., & Kovalchuk, M. V. (2014). Modern approaches to investigation of thin films and monolayers: X-ray reflectivity, grazing-incidence X-ray scattering and X-ray standing waves. Russian Chemical Reviews, 83(12), 1091-1119. https://doi.org/10.1070/RCR4485

Vancouver

Shcherbina MA, Chvalun SN, Ponomarenko SA, Kovalchuk MV. Modern approaches to investigation of thin films and monolayers: X-ray reflectivity, grazing-incidence X-ray scattering and X-ray standing waves. Russian Chemical Reviews. 2014;83(12):1091-1119. https://doi.org/10.1070/RCR4485

Author

Shcherbina, M. A. ; Chvalun, S. N. ; Ponomarenko, S. A. ; Kovalchuk, M. V. / Modern approaches to investigation of thin films and monolayers : X-ray reflectivity, grazing-incidence X-ray scattering and X-ray standing waves. в: Russian Chemical Reviews. 2014 ; Том 83, № 12. стр. 1091-1119.

BibTeX

@article{41ff10173b874901b7e9a833e37e76bc,
title = "Modern approaches to investigation of thin films and monolayers: X-ray reflectivity, grazing-incidence X-ray scattering and X-ray standing waves",
abstract = "The review concerns modern experimental methods of structure determination of thin films of different nature. The methods are based on total reflection of X-rays from the surface and include X-ray reflectivity, grazing-incidence X-ray scattering and X-ray standing waves. Their potential is exemplified by the investigations of various organic macromolecular systems that exhibit the properties of semiconductors and are thought to be promising as thin-film transistors, light-emitting diodes and photovoltaic cells. It is shown that combination of the title methods enable high-precision investigations of the structure of thin-film materials and structure formation in them, i.e., it is possible to obtain information necessary for improvement of the operating efficiency of elements of organic electronic devices. The bibliography includes 92 references.",
author = "Shcherbina, {M. A.} and Chvalun, {S. N.} and Ponomarenko, {S. A.} and Kovalchuk, {M. V.}",
note = "Publisher Copyright: {\textcopyright} 2014 Russian Academy of Sciences and Turpion Ltd.",
year = "2014",
doi = "10.1070/RCR4485",
language = "English",
volume = "83",
pages = "1091--1119",
journal = "Russian Chemical Reviews",
issn = "0036-021X",
publisher = "Turpion Ltd.",
number = "12",

}

RIS

TY - JOUR

T1 - Modern approaches to investigation of thin films and monolayers

T2 - X-ray reflectivity, grazing-incidence X-ray scattering and X-ray standing waves

AU - Shcherbina, M. A.

AU - Chvalun, S. N.

AU - Ponomarenko, S. A.

AU - Kovalchuk, M. V.

N1 - Publisher Copyright: © 2014 Russian Academy of Sciences and Turpion Ltd.

PY - 2014

Y1 - 2014

N2 - The review concerns modern experimental methods of structure determination of thin films of different nature. The methods are based on total reflection of X-rays from the surface and include X-ray reflectivity, grazing-incidence X-ray scattering and X-ray standing waves. Their potential is exemplified by the investigations of various organic macromolecular systems that exhibit the properties of semiconductors and are thought to be promising as thin-film transistors, light-emitting diodes and photovoltaic cells. It is shown that combination of the title methods enable high-precision investigations of the structure of thin-film materials and structure formation in them, i.e., it is possible to obtain information necessary for improvement of the operating efficiency of elements of organic electronic devices. The bibliography includes 92 references.

AB - The review concerns modern experimental methods of structure determination of thin films of different nature. The methods are based on total reflection of X-rays from the surface and include X-ray reflectivity, grazing-incidence X-ray scattering and X-ray standing waves. Their potential is exemplified by the investigations of various organic macromolecular systems that exhibit the properties of semiconductors and are thought to be promising as thin-film transistors, light-emitting diodes and photovoltaic cells. It is shown that combination of the title methods enable high-precision investigations of the structure of thin-film materials and structure formation in them, i.e., it is possible to obtain information necessary for improvement of the operating efficiency of elements of organic electronic devices. The bibliography includes 92 references.

UR - http://www.scopus.com/inward/record.url?scp=84920644443&partnerID=8YFLogxK

U2 - 10.1070/RCR4485

DO - 10.1070/RCR4485

M3 - Review article

AN - SCOPUS:84920644443

VL - 83

SP - 1091

EP - 1119

JO - Russian Chemical Reviews

JF - Russian Chemical Reviews

SN - 0036-021X

IS - 12

ER -

ID: 88207349