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METHOD OF EXAMINING THE NUMBER OF ELECTRONS PRODUCED IN AN ELEMENTARY ACT OF FIELD EMISSION. / Afnas'eva, N. P.; Egorov, N. V.; Kocheryzhenkov, A. V.; Fursei, G. N.

в: Instruments and experimental techniques New York, Том 25, № 5 pt 2, 1982, стр. 1204-1206.

Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование

Harvard

Afnas'eva, NP, Egorov, NV, Kocheryzhenkov, AV & Fursei, GN 1982, 'METHOD OF EXAMINING THE NUMBER OF ELECTRONS PRODUCED IN AN ELEMENTARY ACT OF FIELD EMISSION.', Instruments and experimental techniques New York, Том. 25, № 5 pt 2, стр. 1204-1206.

APA

Afnas'eva, N. P., Egorov, N. V., Kocheryzhenkov, A. V., & Fursei, G. N. (1982). METHOD OF EXAMINING THE NUMBER OF ELECTRONS PRODUCED IN AN ELEMENTARY ACT OF FIELD EMISSION. Instruments and experimental techniques New York, 25(5 pt 2), 1204-1206.

Vancouver

Afnas'eva NP, Egorov NV, Kocheryzhenkov AV, Fursei GN. METHOD OF EXAMINING THE NUMBER OF ELECTRONS PRODUCED IN AN ELEMENTARY ACT OF FIELD EMISSION. Instruments and experimental techniques New York. 1982;25(5 pt 2):1204-1206.

Author

Afnas'eva, N. P. ; Egorov, N. V. ; Kocheryzhenkov, A. V. ; Fursei, G. N. / METHOD OF EXAMINING THE NUMBER OF ELECTRONS PRODUCED IN AN ELEMENTARY ACT OF FIELD EMISSION. в: Instruments and experimental techniques New York. 1982 ; Том 25, № 5 pt 2. стр. 1204-1206.

BibTeX

@article{e69578095b574c83826d3e620b3f699c,
title = "METHOD OF EXAMINING THE NUMBER OF ELECTRONS PRODUCED IN AN ELEMENTARY ACT OF FIELD EMISSION.",
abstract = "An improved apparatus is described for examining the numbers of electrons produced in elementary acts of field emission. Multiple acts of emission related to parasitic secondary effects are not recorded. The field-emission image is visualized. A probe system is used with a mobile cathode unit to make measurements on different crystallographic planes of a single crystal. A surface-barrier gold-silicon detector records electrons of energy 10 kev with a resolution of 2. 8 kev. The working pulse length in the spectrometer is 5 mu sec and the average count rate is approximately 500 count/sec, and the sensitivity in observing double acts of emission is approximately 0. 1%.",
author = "Afnas'eva, {N. P.} and Egorov, {N. V.} and Kocheryzhenkov, {A. V.} and Fursei, {G. N.}",
year = "1982",
language = "English",
volume = "25",
pages = "1204--1206",
journal = "Instruments and Experimental Techniques",
issn = "0020-4412",
publisher = "МАИК {"}Наука/Интерпериодика{"}",
number = "5 pt 2",

}

RIS

TY - JOUR

T1 - METHOD OF EXAMINING THE NUMBER OF ELECTRONS PRODUCED IN AN ELEMENTARY ACT OF FIELD EMISSION.

AU - Afnas'eva, N. P.

AU - Egorov, N. V.

AU - Kocheryzhenkov, A. V.

AU - Fursei, G. N.

PY - 1982

Y1 - 1982

N2 - An improved apparatus is described for examining the numbers of electrons produced in elementary acts of field emission. Multiple acts of emission related to parasitic secondary effects are not recorded. The field-emission image is visualized. A probe system is used with a mobile cathode unit to make measurements on different crystallographic planes of a single crystal. A surface-barrier gold-silicon detector records electrons of energy 10 kev with a resolution of 2. 8 kev. The working pulse length in the spectrometer is 5 mu sec and the average count rate is approximately 500 count/sec, and the sensitivity in observing double acts of emission is approximately 0. 1%.

AB - An improved apparatus is described for examining the numbers of electrons produced in elementary acts of field emission. Multiple acts of emission related to parasitic secondary effects are not recorded. The field-emission image is visualized. A probe system is used with a mobile cathode unit to make measurements on different crystallographic planes of a single crystal. A surface-barrier gold-silicon detector records electrons of energy 10 kev with a resolution of 2. 8 kev. The working pulse length in the spectrometer is 5 mu sec and the average count rate is approximately 500 count/sec, and the sensitivity in observing double acts of emission is approximately 0. 1%.

UR - http://www.scopus.com/inward/record.url?scp=0020176737&partnerID=8YFLogxK

M3 - Article

AN - SCOPUS:0020176737

VL - 25

SP - 1204

EP - 1206

JO - Instruments and Experimental Techniques

JF - Instruments and Experimental Techniques

SN - 0020-4412

IS - 5 pt 2

ER -

ID: 88988162