Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование
Method for determining optical constants and the thickness of the thin film. / Karpov, A. G.; Klemeshev, V. A.
в: Vestnik Sankt-Peterburgskogo Universiteta, Prikladnaya Matematika, Informatika, Protsessy Upravleniya, Том 13, № 1, 2017, стр. 17-26.Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование
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TY - JOUR
T1 - Method for determining optical constants and the thickness of the thin film
AU - Karpov, A. G.
AU - Klemeshev, V. A.
PY - 2017
Y1 - 2017
N2 - Here are presented the results of the development and application of methods for determining the optical constants and thickness of thin films. The generalized target model function is formed to determine the unmeasured parameters. The model is applied by using the least squares method and the steepest descent. Increased efficiency is achieved by using a three-step processing algorithm. The proposed method was applied to calculate the characteristics of the multi-alkali photocathode, which is a complex compound having in its composition antimonides of potassium, sodium and cesium. A comparison of the calculation results with the data given in the literature is presented.
AB - Here are presented the results of the development and application of methods for determining the optical constants and thickness of thin films. The generalized target model function is formed to determine the unmeasured parameters. The model is applied by using the least squares method and the steepest descent. Increased efficiency is achieved by using a three-step processing algorithm. The proposed method was applied to calculate the characteristics of the multi-alkali photocathode, which is a complex compound having in its composition antimonides of potassium, sodium and cesium. A comparison of the calculation results with the data given in the literature is presented.
KW - Optical constants
KW - The data processing algorithm
KW - The generalized target model function
KW - The thickness of the thin film
KW - Thin film
UR - http://www.scopus.com/inward/record.url?scp=85031094908&partnerID=8YFLogxK
U2 - 10.21638/11701/spbu10.2017.102
DO - 10.21638/11701/spbu10.2017.102
M3 - Article
AN - SCOPUS:85031094908
VL - 13
SP - 17
EP - 26
JO - ВЕСТНИК САНКТ-ПЕТЕРБУРГСКОГО УНИВЕРСИТЕТА. ПРИКЛАДНАЯ МАТЕМАТИКА. ИНФОРМАТИКА. ПРОЦЕССЫ УПРАВЛЕНИЯ
JF - ВЕСТНИК САНКТ-ПЕТЕРБУРГСКОГО УНИВЕРСИТЕТА. ПРИКЛАДНАЯ МАТЕМАТИКА. ИНФОРМАТИКА. ПРОЦЕССЫ УПРАВЛЕНИЯ
SN - 1811-9905
IS - 1
ER -
ID: 9293836