Standard

Measurement of source profile of proton beams generated by ultraintense laser pulses using a Thomson mass spectrometer. / Oishi, Y.; Nayuki, T.; Fujii, T.; Takizawa, Y.; Wang, X.; Yamazaki, T.; Nemoto, K.; Sekiya, T.; Horioka, K.; Andreev, A. A.

в: Journal of Applied Physics, Том 97, № 10, 104906, 15.05.2005.

Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование

Harvard

Oishi, Y, Nayuki, T, Fujii, T, Takizawa, Y, Wang, X, Yamazaki, T, Nemoto, K, Sekiya, T, Horioka, K & Andreev, AA 2005, 'Measurement of source profile of proton beams generated by ultraintense laser pulses using a Thomson mass spectrometer', Journal of Applied Physics, Том. 97, № 10, 104906. https://doi.org/10.1063/1.1896442

APA

Oishi, Y., Nayuki, T., Fujii, T., Takizawa, Y., Wang, X., Yamazaki, T., Nemoto, K., Sekiya, T., Horioka, K., & Andreev, A. A. (2005). Measurement of source profile of proton beams generated by ultraintense laser pulses using a Thomson mass spectrometer. Journal of Applied Physics, 97(10), [104906]. https://doi.org/10.1063/1.1896442

Vancouver

Oishi Y, Nayuki T, Fujii T, Takizawa Y, Wang X, Yamazaki T и пр. Measurement of source profile of proton beams generated by ultraintense laser pulses using a Thomson mass spectrometer. Journal of Applied Physics. 2005 Май 15;97(10). 104906. https://doi.org/10.1063/1.1896442

Author

Oishi, Y. ; Nayuki, T. ; Fujii, T. ; Takizawa, Y. ; Wang, X. ; Yamazaki, T. ; Nemoto, K. ; Sekiya, T. ; Horioka, K. ; Andreev, A. A. / Measurement of source profile of proton beams generated by ultraintense laser pulses using a Thomson mass spectrometer. в: Journal of Applied Physics. 2005 ; Том 97, № 10.

BibTeX

@article{a284ef5c1b184ac49cb8347dcb1a01d7,
title = "Measurement of source profile of proton beams generated by ultraintense laser pulses using a Thomson mass spectrometer",
abstract = "For measuring the source profile of proton beams, a method using a Thomson mass spectrometer, which has precise energy resolution and enables the discrimination of ion species, was proposed and applied in an experiment with irradiation of 55-fs, 6.6× 1018 -W cm2 -laser pulses on a 5-μm -thick copper tape target. The typical measured source size was 150 μm at E=400 keV and 44 μm at E=980 keV in full width at half maximum.",
author = "Y. Oishi and T. Nayuki and T. Fujii and Y. Takizawa and X. Wang and T. Yamazaki and K. Nemoto and T. Sekiya and K. Horioka and Andreev, {A. A.}",
year = "2005",
month = may,
day = "15",
doi = "10.1063/1.1896442",
language = "English",
volume = "97",
journal = "Journal of Applied Physics",
issn = "0021-8979",
publisher = "American Institute of Physics",
number = "10",

}

RIS

TY - JOUR

T1 - Measurement of source profile of proton beams generated by ultraintense laser pulses using a Thomson mass spectrometer

AU - Oishi, Y.

AU - Nayuki, T.

AU - Fujii, T.

AU - Takizawa, Y.

AU - Wang, X.

AU - Yamazaki, T.

AU - Nemoto, K.

AU - Sekiya, T.

AU - Horioka, K.

AU - Andreev, A. A.

PY - 2005/5/15

Y1 - 2005/5/15

N2 - For measuring the source profile of proton beams, a method using a Thomson mass spectrometer, which has precise energy resolution and enables the discrimination of ion species, was proposed and applied in an experiment with irradiation of 55-fs, 6.6× 1018 -W cm2 -laser pulses on a 5-μm -thick copper tape target. The typical measured source size was 150 μm at E=400 keV and 44 μm at E=980 keV in full width at half maximum.

AB - For measuring the source profile of proton beams, a method using a Thomson mass spectrometer, which has precise energy resolution and enables the discrimination of ion species, was proposed and applied in an experiment with irradiation of 55-fs, 6.6× 1018 -W cm2 -laser pulses on a 5-μm -thick copper tape target. The typical measured source size was 150 μm at E=400 keV and 44 μm at E=980 keV in full width at half maximum.

UR - http://www.scopus.com/inward/record.url?scp=20944431587&partnerID=8YFLogxK

U2 - 10.1063/1.1896442

DO - 10.1063/1.1896442

M3 - Article

AN - SCOPUS:20944431587

VL - 97

JO - Journal of Applied Physics

JF - Journal of Applied Physics

SN - 0021-8979

IS - 10

M1 - 104906

ER -

ID: 85670682