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I-V curve investigation with regression methods. / Antonov, Andrei Yu; Varayun, Marina I.

2016 14th International Baltic Conference on Atomic Layer Deposition, BALD 2016 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2017. стр. 41-43 7886533.

Результаты исследований: Публикации в книгах, отчётах, сборниках, трудах конференцийстатья в сборнике материалов конференциинаучнаяРецензирование

Harvard

Antonov, AY & Varayun, MI 2017, I-V curve investigation with regression methods. в 2016 14th International Baltic Conference on Atomic Layer Deposition, BALD 2016 - Proceedings., 7886533, Institute of Electrical and Electronics Engineers Inc., стр. 41-43, 14th International Baltic Conference on Atomic Layer Deposition, BALD 2016, St. Petersburg, Российская Федерация, 1/10/16. https://doi.org/10.1109/BALD.2016.7886533

APA

Antonov, A. Y., & Varayun, M. I. (2017). I-V curve investigation with regression methods. в 2016 14th International Baltic Conference on Atomic Layer Deposition, BALD 2016 - Proceedings (стр. 41-43). [7886533] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/BALD.2016.7886533

Vancouver

Antonov AY, Varayun MI. I-V curve investigation with regression methods. в 2016 14th International Baltic Conference on Atomic Layer Deposition, BALD 2016 - Proceedings. Institute of Electrical and Electronics Engineers Inc. 2017. стр. 41-43. 7886533 https://doi.org/10.1109/BALD.2016.7886533

Author

Antonov, Andrei Yu ; Varayun, Marina I. / I-V curve investigation with regression methods. 2016 14th International Baltic Conference on Atomic Layer Deposition, BALD 2016 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2017. стр. 41-43

BibTeX

@inproceedings{92fc51bbd0774e809f9134ce7f598b83,
title = "I-V curve investigation with regression methods",
abstract = "Currently, field electron emission is an indispensable tool for studying advanced materials. Analysis of the current-voltage (I-V ) dependences allows us to derive information about some characteristics of the field-emission cathode (i.e., work function or field enhancement factor values). It is known that in the Fowler-Nordheim coordinates I-V curve is linear. A linear approximation can be constructed with the method of ordinary least squares (OLS). OLS is one of the basic methods of regression analysis used to estimate unknown parameters of regression models. However, reliable confidence intervals for the regression coefficients can only be easily obtained if the model residuals are normally distributed. This is impossible to assume about the log-transformed I-V curve. The scope of this paper is modeling of I-V dependence. The random errors of I measurements are normally distributed. We have constructed estimations of the coefficients in Fowler-Nordheim law (i.e. A and B) using methods of linear and nonlinear regression and shown that those approaches give different results. Errors of determining of the coefficients A and B are presented.",
author = "Antonov, {Andrei Yu} and Varayun, {Marina I.}",
year = "2017",
month = mar,
day = "24",
doi = "10.1109/BALD.2016.7886533",
language = "English",
pages = "41--43",
booktitle = "2016 14th International Baltic Conference on Atomic Layer Deposition, BALD 2016 - Proceedings",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
address = "United States",
note = "14th International Baltic Conference on Atomic Layer Deposition, BALD 2016 ; Conference date: 01-10-2016 Through 03-10-2016",

}

RIS

TY - GEN

T1 - I-V curve investigation with regression methods

AU - Antonov, Andrei Yu

AU - Varayun, Marina I.

PY - 2017/3/24

Y1 - 2017/3/24

N2 - Currently, field electron emission is an indispensable tool for studying advanced materials. Analysis of the current-voltage (I-V ) dependences allows us to derive information about some characteristics of the field-emission cathode (i.e., work function or field enhancement factor values). It is known that in the Fowler-Nordheim coordinates I-V curve is linear. A linear approximation can be constructed with the method of ordinary least squares (OLS). OLS is one of the basic methods of regression analysis used to estimate unknown parameters of regression models. However, reliable confidence intervals for the regression coefficients can only be easily obtained if the model residuals are normally distributed. This is impossible to assume about the log-transformed I-V curve. The scope of this paper is modeling of I-V dependence. The random errors of I measurements are normally distributed. We have constructed estimations of the coefficients in Fowler-Nordheim law (i.e. A and B) using methods of linear and nonlinear regression and shown that those approaches give different results. Errors of determining of the coefficients A and B are presented.

AB - Currently, field electron emission is an indispensable tool for studying advanced materials. Analysis of the current-voltage (I-V ) dependences allows us to derive information about some characteristics of the field-emission cathode (i.e., work function or field enhancement factor values). It is known that in the Fowler-Nordheim coordinates I-V curve is linear. A linear approximation can be constructed with the method of ordinary least squares (OLS). OLS is one of the basic methods of regression analysis used to estimate unknown parameters of regression models. However, reliable confidence intervals for the regression coefficients can only be easily obtained if the model residuals are normally distributed. This is impossible to assume about the log-transformed I-V curve. The scope of this paper is modeling of I-V dependence. The random errors of I measurements are normally distributed. We have constructed estimations of the coefficients in Fowler-Nordheim law (i.e. A and B) using methods of linear and nonlinear regression and shown that those approaches give different results. Errors of determining of the coefficients A and B are presented.

UR - http://www.scopus.com/inward/record.url?scp=85017261986&partnerID=8YFLogxK

U2 - 10.1109/BALD.2016.7886533

DO - 10.1109/BALD.2016.7886533

M3 - Conference contribution

AN - SCOPUS:85017261986

SP - 41

EP - 43

BT - 2016 14th International Baltic Conference on Atomic Layer Deposition, BALD 2016 - Proceedings

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 14th International Baltic Conference on Atomic Layer Deposition, BALD 2016

Y2 - 1 October 2016 through 3 October 2016

ER -

ID: 9425270