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Interface formation between Be and W layers depending on its thickness and ordering. / Sakhonenkov, Sergei S.; Filatova, Elena O.

в: Applied Surface Science, Том 534, 147636, 30.12.2020, стр. 147636.

Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование

Harvard

Sakhonenkov, SS & Filatova, EO 2020, 'Interface formation between Be and W layers depending on its thickness and ordering', Applied Surface Science, Том. 534, 147636, стр. 147636. https://doi.org/doi.org/10.1016/j.apsusc.2020.147636

APA

Sakhonenkov, S. S., & Filatova, E. O. (2020). Interface formation between Be and W layers depending on its thickness and ordering. Applied Surface Science, 534, 147636. [147636]. https://doi.org/doi.org/10.1016/j.apsusc.2020.147636

Vancouver

Sakhonenkov SS, Filatova EO. Interface formation between Be and W layers depending on its thickness and ordering. Applied Surface Science. 2020 Дек. 30;534:147636. 147636. https://doi.org/doi.org/10.1016/j.apsusc.2020.147636

Author

Sakhonenkov, Sergei S. ; Filatova, Elena O. / Interface formation between Be and W layers depending on its thickness and ordering. в: Applied Surface Science. 2020 ; Том 534. стр. 147636.

BibTeX

@article{2e7f295721ea457db80e23ae449670a4,
title = "Interface formation between Be and W layers depending on its thickness and ordering",
abstract = "In the present work, formation of interfaces in the W/Be layered structures was studied using X-ray photoelectron spectroscopy. Chemical composition and significance of the interfaces depending on the thickness and ordering of beryllium and tungsten layers were investigated by means of the XPS spectra decomposition technique. The formation of tungsten beryllides WBe2 and WBe12 at the W-on-Be and Be-on-W interfaces, respectively, was revealed. The thickness of WBe2 beryllide does not depend on the thickness of a tungsten top layer, whereas WBe12 thickness increases with increasing Be top layer thickness. Additionally, oxidation of a Be layer under a thin W layer was established and possible mechanism underlying this process was proposed.",
keywords = "Keywords: X-ray photoelectron spectroscopy Peak fitting Thin films Chemical states Be/W and W/Be oxidation mechanisms, X-ray photoelectron spectroscopy, Peak fitting, Thin films, Chemical states, Be/W and W/Be oxidation mechanisms, MULTILAYER MIRRORS, STABILITY, BERYLLIUM-OXIDE, FILMS, X-RAY, TUNGSTEN, XPS, RANGE",
author = "Sakhonenkov, {Sergei S.} and Filatova, {Elena O.}",
note = "Publisher Copyright: {\textcopyright} 2020 Elsevier B.V.",
year = "2020",
month = dec,
day = "30",
doi = "doi.org/10.1016/j.apsusc.2020.147636",
language = "English",
volume = "534",
pages = "147636",
journal = "Applied Surface Science",
issn = "0169-4332",
publisher = "Elsevier",

}

RIS

TY - JOUR

T1 - Interface formation between Be and W layers depending on its thickness and ordering

AU - Sakhonenkov, Sergei S.

AU - Filatova, Elena O.

N1 - Publisher Copyright: © 2020 Elsevier B.V.

PY - 2020/12/30

Y1 - 2020/12/30

N2 - In the present work, formation of interfaces in the W/Be layered structures was studied using X-ray photoelectron spectroscopy. Chemical composition and significance of the interfaces depending on the thickness and ordering of beryllium and tungsten layers were investigated by means of the XPS spectra decomposition technique. The formation of tungsten beryllides WBe2 and WBe12 at the W-on-Be and Be-on-W interfaces, respectively, was revealed. The thickness of WBe2 beryllide does not depend on the thickness of a tungsten top layer, whereas WBe12 thickness increases with increasing Be top layer thickness. Additionally, oxidation of a Be layer under a thin W layer was established and possible mechanism underlying this process was proposed.

AB - In the present work, formation of interfaces in the W/Be layered structures was studied using X-ray photoelectron spectroscopy. Chemical composition and significance of the interfaces depending on the thickness and ordering of beryllium and tungsten layers were investigated by means of the XPS spectra decomposition technique. The formation of tungsten beryllides WBe2 and WBe12 at the W-on-Be and Be-on-W interfaces, respectively, was revealed. The thickness of WBe2 beryllide does not depend on the thickness of a tungsten top layer, whereas WBe12 thickness increases with increasing Be top layer thickness. Additionally, oxidation of a Be layer under a thin W layer was established and possible mechanism underlying this process was proposed.

KW - Keywords: X-ray photoelectron spectroscopy Peak fitting Thin films Chemical states Be/W and W/Be oxidation mechanisms

KW - X-ray photoelectron spectroscopy

KW - Peak fitting

KW - Thin films

KW - Chemical states

KW - Be/W and W/Be oxidation mechanisms

KW - MULTILAYER MIRRORS

KW - STABILITY

KW - BERYLLIUM-OXIDE

KW - FILMS

KW - X-RAY

KW - TUNGSTEN

KW - XPS

KW - RANGE

UR - https://www.sciencedirect.com/science/article/abs/pii/S016943322032393X

UR - http://www.scopus.com/inward/record.url?scp=85089937838&partnerID=8YFLogxK

UR - https://www.mendeley.com/catalogue/4eec9430-8964-36ff-8644-b774d65b0215/

U2 - doi.org/10.1016/j.apsusc.2020.147636

DO - doi.org/10.1016/j.apsusc.2020.147636

M3 - Article

VL - 534

SP - 147636

JO - Applied Surface Science

JF - Applied Surface Science

SN - 0169-4332

M1 - 147636

ER -

ID: 61630758